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Welcome to the Dresden Center for Nanoanalysis (DCN)

The Dresden Center for Nanoanalysis (DCN) is an interdis­ciplinary technological platform of Technische Universität Dresden and the Center for Advancing Electronics Dresden (cfaed) in the field of nanoscale materials analysis. The vision of the highly motivated DCN team is to establish it as an internationally visible center of competence in the field of 4D materials analysis as well as an European user center. 

Leading-edge research is performed in the field of three-dimensional imaging and analysis of kinetic processes in materials and structures down to the atomic scale. The first research projects of the newly formed center focus on the study of solid-state physical phenomena and processes in innovative electronic devices based on one-dimensional nanostructures such as silicon nanowires and carbon nano-tubes as well as nanoscale sensors. These devices are expected to have a much higher perfor­mance than current CMOS devices and sensor systems. The analytical results will be interpreted jointly with researchers of the Silicon Nanowire and Organic Paths.

In November 2013, two novel analytical tools, a scanning electron microscope with a focused ion beam (SEM/FIB) and a sub-micrometer X-ray tomograph, were installed. The DCN team works closely together with non-uni­versity institutes in Dresden, linked within the so-called DRESDEN-concept. The strong collaboration with the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA) is particularly focused on applied materials-related research for a broad range of new applica­tions in the fields of automotive, mechanical engineering, logistics, energy, sensor technology as well as medical engineering and health monitoring. Strategic partnerships with innovative companies have been established to align the research on industrial needs. 
Find out more about the DCN

Invitation to our next event - the 2nd Dresden Nanoanalysis Symposium

July 2nd, 2014
09:00 - 18:30

2nd Dresden Nanoanalysis Symposium (DNS)
Internationales Congress Center Dresden, Ostra-Ufer 2, 01067 Dresden

The 2nd Dresden Nanoanalysis Symposium (DNS), organized by the Dresden Center for Nanoanalysis at Technische Universität Dresden and the Dresden Fraunhofer Cluster Nanoanalyis, will be held in Dresden, Germany, on July 2, 2014. The workshop will provide a forum for presenting current research and for discussions on issues related to nanoanalysis and its applications in materials science and engineering, advanced electronics, energy research and other fields. Following the spirit of previous workshops, new research results and advances in basic understanding will be emphasized. Participants of the 2nd DNS are also invited to visit the Nanofair 2014 event, which is jointly organized with the 2nd DNS and will take place at the same time. Get all information here

Call for Papers ... The best 3 posters will be awarded with a poster prize (300 Euro, 200 Euro, 100 Euro)!!!
Online Registration ... available now!! 
Programm ... online!!

All information about the event you get here

Invited Speaker

Tom Wirtz, Centre de Recherche Public - Gabriel Lippmann, Luxembourg, LUXEMBOURG
SIMS based correlative microscopy for high-resolution high-sensitivity nano-analytics
Stefan Braun, Fraunhofer IWS Dresden, Dresden, GERMANY
Perspectives of X-ray microscopy by using multilayer Laue lens optics
Michael Kopnarski, Institut für Oberflächen- und Schichtanalytik GmbH, Kaiserslautern, GERMANY
Application of the 3D atom probe to materials problems
Ai Leen Koh, Stanford University, California, USA
Applications of environmental (scanning) transmission electron microscopy to studyoxidation and hydrogenation phenomena in nanomaterials  
Erdmann Spiecker, Universität Erlangen, Erlangen, GERMANY
Advanced transmission electron microscopy in materials and nanoscience
Michael Lehmann, Technische Universität Berlin, Berlin, GERMANY
Quantitative TEM and electron holography for analysis of nanophotonic devices on the (sub-)nanometer scale
Jean-Paul Barnes, Animateur-Centre de Compétence "Faisceaux d'Ions" DTSi (SCMC), Grenoble, FRANCE
Molecular depth profiling for organic electronics using argon cluster ion beams
Martin KalbacJ. Heyrovsky Institute of Physical Chemistry of the Academy of Sciences, Prague, CZECH REPUBLIC
Spectroscopy and spectroelectrochemistry of isotopically labelled graphene layers
Markus Löffler, Technische Universität Dresden/DCN, Dresden, GERMANY
Electron microscopy at structures for 1D electronics
Frank Stietz, Carl Zeiss Microscopy, Oberkochen, GERMANY
Innovative 3D nanoanalysis
Eva Olsson, Chalmers University of Technology, Gothenburg, SWEDEN
Correlating the active properties of interfaces and nanostructures to their nano and atomic scale structure using advanced electron microscopy
César Magén, Universidad de Zaragoza, Zaragoza, SPAIN
Atomic resolution STEM imaging and chemical mapping of oxide nanostructures

Impressions of the DCN


Research Group

Linda Kriusk, Alexander Tahn, Sayanti Banerjee, Jin Huang, Markus Löffler (f.l.t.r.)

Official Opening Ceremony
Ehrenfried Zschech (DCN), Gerhard Fettweis (Coordinator of the cfaed), Serge Haroche (nobel prize winner in physics 2012), Hans Müller-Steinhagen (rector TUD) - (f.l.t.r.)

The DCN with a booth at the Vision Keramik at the Fraunhofer IKTS in Dresden



Last modified: 10.04.2014 15:38
Author: Linda Kriusk


p> Ehrenfried Zschech
Scientific Coordinator

Tel.: +49 351 463-41093
Fax: +49 351 463-31985

Linda Kriusk
Administration Manager
Tel.: +49 351 463-41093
Fax: +49 351 463-31985

TU Dresden
Dresden Center for Nanoanalysis (DCN)
Helmholtzstraße 18
Barkhausen Building
Room: 168

01187 Dresden, Germany
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Mail to:
TU Dresden
Dresden Center for Nanoanalysis (DCN)
Linda Kriusk
D-01062 Dresden