Review of the „23. Oldenburger 3D-Tage zu Gast in Dresden“

For the first time in 22 years, the "Oldenburger 3D-Tage" did not take place in Oldenburg, but in Dresden. Here, too, the event successfully proved that it is one of the most important specialist events in the field of Optical 3D-Metrology in the German-speaking world. More than 200 experts from science, industry, services and applications came together at the invitation of the University of Applied Sciences Dresden (HTW Dresden), the TUD Dresden University of Technology and the Jade University of Applied Sciences Oldenburg on the premises of the HTW Dresden to discuss new developments, innovative solutions and current challenges in photogrammetry, laser scanning and industrial metrology. Many students also took the opportunity to make contacts with scientists and company representatives.

The conference was opened by Prof. Dr.-Ing. Danilo Schneider (HTW Dresden), who welcomed the participants with a review of the history of the Oldenburger 3D-Tage. Prof. Dr. rer. nat. Kathrin Harre, Vice-Rector Research, Sustainability and Transfer at HTW Dresden, and Dipl.-Ing. Felix Raderecht, Chairman of DVW e.V. - Gesellschaft für Geodäsie, Geoinformation und Landmanagement Sachsen, gave welcoming addresses.

The first day of the conference offered parallel sessions in the morning on the topics of engineering geodesy and cultural heritage. This was followed in the afternoon by contributions on laser scanning and point cloud processing as well as the Young Scientists Forum, which offered young scientists a platform for their research work. The technical programme concluded with another session on cultural heritage and the session on industrial surveying organized by the Competence Group for Industrial Surveying (KKIV). In the evening, the Sophienkeller restaurant in Dresden hosted an atmospheric evening event with a Saxon buffet and an entertaining interlude by August der Starke.

The second day was dedicated to the basics and applications of photogrammetric measurement technology in the morning, supplemented by contributions from AG3D and a session on artificial intelligence in 3D metrology. In the afternoon, the focus was on quality control in construction, BIM (Building Information Modeling) and immersive visualization techniques. The conference ended with a concluding discussion round and a welcome address by Danilo Schneider.

The technical program was accompanied by a company exhibition with over 20 partners - including global companies as well as local companies - who presented the latest sensor technology and software. The exhibition was very well attended and was used for networking.

The conference offered participants valuable specialist information, practical insights and an excellent platform for professional exchange on current developments in optical 3D metrology.
Special thanks go to ZAFT e.V. - Center for Applied Research and Technology for its administrative support and to all the helpers on site who made this successful premiere in Dresden possible.

The venue for the next Oldenburg 3D Days will be announced shortly.