JPK Nanowizard4 AFM

The NanoWizard4 AFM from JPK is a high-end device providing the following features:

• measurements in air and in liquid environment
• 'classical' contact-, tapping and force spectroscopy modes
• force modulation mode
• advanced "QI" mode (high-speed force mapping imaging w/ full force-curve data for each pixel)
• in combination w/ inverted optical microscope – allows for correlative measurements
• "DirectOverlay" feature for precise alignment of optical and AFM images
• additional "Top view optics" allow for observing opaque samples from top
• temperature control for fluid samples
• "CellHesion" module extends accessible z-range to 100 µm for, e.g., cell imaging
• data processing software

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© Jens Ehrig