Details zur Lehrveranstaltung
| Physical Characterization of Organic and Organic-Inorganic Thin Films | |||||||
| Vorlesungssprache | Englisch | ||||||
| Inhalt der Lehrveranstaltung: | The course will teach techniques for the characterization of thin organic, inorganic and/or hybrid organic-inorganic thin films and materials. It focusses on physical characterization methods that aim at unveiling the structure and chemical composition of semiconductors, metals, organic and hybrid materials and devices utilized in modern (organic) electronics down to the nanometer scale. The methods introduced in the course comprise scanning and transmission electron microscopy (SEM, TEM) including in-situ techniques (in-situ TEM), atomic force microscopy (AFM), X-ray microscopy and tomography (XCT), correlative microscopy approaches, nanomechanical testing, ellipsometry, photoelectron spectroscopy (PES) and X-ray based scattering techniques such as gracing incidence wide angle X-ray scattering (GIWAXS) and small angle X-ray scattering (SAXS). The close correlation of structure and composition with potential applications and the performance of devices will be addressed. | ||||||
| Datensatz aktualisiert | |||||||
| Umfang: | Vorlesung: 2 Stunden/Woche Übungen/Seminare: 2 Stunden/Woche | ||||||
| Zeit/Ort: | DO(5) BAR/II62 | ||||||
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| Hörerkreis: | Master Organic and Molecular Electronics | ||||||
| Vorkenntnisse: | Participants should have basic knowledge in physics, in particular in classical mechanics and solid state physics. | Nachweis: | |||||
| Einschreibung: | Enrollment is mandatory! See web link below. | ||||||
| Web-Referenz: | https://bildungsportal.sachsen.de/opal/auth/RepositoryEntry/36989304837 | ||||||