Details zur Lehrveranstal­tung

Physical Characterization of Organic and Organic-Inorganic Thin Films
Lecture language	German
Summary of Lecture:	The course will teach techniques for the characterization of thin organic, inorganic and/or hybrid organic-inorganic thin films and materials. It focusses on physical characterization methods that aim at unveiling the structure and chemical composition of semiconductors, metals, organic and hybrid materials and devices utilized in modern (organic) electronics down to the nanometer scale. The methods introduced in the course comprise scanning and transmission electron microscopy (SEM, TEM) including in-situ techniques (in-situ TEM), scanning tunneling microscopy (STM), atomic force microscopy (AFM), X-ray microscopy and tomography (XCT), nanomechanical testing, ellipsometry, photoelectron spectroscopy (PES) and X-ray based scattering techniques such as gracing incidence wide angle X-ray scattering (GIWAXS) and small angle X-ray scattering (SAXS). The close correlation of structure and composition with potential applications and the performance of devices will be addressed.
	data set up-to-date
Scope:	lecture: 2 hours/week tutorials: 2 hours/week
Time/location:	DO(5) AVO
Tutorials:	Group     Time/location:     FR(4) BAR/I88
Audience:	Master Organic and Molecular Electronics
Previous knowledge:	Participants should have basic knowledge in physics, in particular in classical mechanics and solid state physics.
Certificate:
Enrolment:	Enrollment is mandatory! See web link below.
Web-reference:	https://bildungsportal.sachsen.de/opal/auth/RepositoryEntry/36989304837
https://bildungsportal.sachsen.de/opal/auth/RepositoryEntry/41703604224