Details zur Lehrveranstaltung
Scanning probe microscopy | |
Modul: | Phy-Ma-Vert: Physikalische Vertiefung |
Lecture language | German |
Summary of Lecture: | Scanning tunneling microscopy, atomic force microscopy, and scanning near-field optical microscopy: physical (tunneling current, atomic forces, optical near field) and instrumental (feedback system, vibration isolation etc.) principles, various modes of operation, applications in physics, chemis- try, and biology (imaging and spectroscopy), nanomanipulation |
data set up-to-date | |
Scope: | lecture: 2 hours/week |
Time/location: | MO(5) BEY/98 |
Audience: | Vertiefung Bachelor (PV) und Master (alle) |
Specialization area: | Angewandte Festkörperphysik und Photonik (Vorlesung im Wahlpflichtvertiefungsgebiet) |
Previous knowledge: | Physik-Vordiplom | Certificate: | Schein |
Enrolment: | 1. Vorlesungsstunde am 13.4.20 |
Web-reference: | http://lehre.iap.phy.tu-dresden.de/index.php/vorlesungen/rastersondenmikroskopie |
Vorlesung in Deutsch und Englisch. |