Details zur Lehrveranstaltung
| Scanning probe microscopy | |
| Modul: | Phy-Ma-Vert: Physikalische Vertiefung |
| Lecture language | English |
| Summary of Lecture: | Scanning tunneling microscopy, atomic force microscopy, and scanning near-field optical microscopy; physical principles (tunneling current, atomic forces, optical near field), instrumental realization (feedback system, vibration isolation, etc.), various modes of operation, applications in physics, chemistry, and biology (imaging and spectroscopy), nanomanipulation |
| data set up-to-date | |
| Scope: | lecture: 2 hours/week |
| Time/location: | MO(5) REC/B214 |
| Audience: | Vertiefung Bachelor (PV) und Master (alle) |
| Specialization area: | Angewandte Festkörperphysik und Photonik (Vorlesung im Wahlpflichtvertiefungsgebiet) |
| Previous knowledge: | Physik-Vordiplom | Certificate: | Schein |
| Enrolment: | Erste Vorlesungsstunde (09.04.2018) |
| Web-reference: | https://lehre.iap.phy.tu-dresden.de/materialien/ |
| Vorlesung in Englisch. | |