Published Journals 2013 1 bis 10 von 23 EinträgenKlatt, S.; Allerdißen, M.; Körbitz, R.; Voit, B.; Arndt, K.-F.; Richter, A.: Hydrogel-based microfluidic systems. In: Adv. Sci. Technol. 81 (2013), S. 90–95Paschew, G.; Körbitz, R.; Richter, A.: Multimodal, High-Resolution Imaging System Based On Stimuli-Responsive Polymers. In: Adv. Sci. Technol. 82 (2013), S. 44–49Allerdißen, M.; Greiner, R.; Richter, A.: Microfluidic microchemomechanical systems. In: Adv. Sci. Technol. 81 (2013), S. 84–89Haas, W.; Bartha, J.W.; Fischer, W.-J.; Richter, A.: Chemical microsensors based on hydrogels with adjustable measurement range . In: Proc. SPIE 8763, Smart Sensors, Actuators, and MEMS VI, 87632Z (May 17, 2013) (2013)Singh, A.; Klumbies, H.; Schröder, U.; Müller-Meskamp, L.; Geidel, M.; Knaut, M.; Hoßbach, C.; Albert, M.; Leo, K.; Mikolajick, T.: Barrier performance optimization of atomic layer deposited diffusion barriers for organic light emitting diodes using x-ray reflectivity investigations. In: Appl. Phys. Lett. 103, 233302 (2013)Wysokowski, M.; Motylenko, M.; Stöcker, H.; Bazhenov, V.V.; Langer, E.; Dobrowolska, A.; Czaczyk, K.; Galli, R.; Stelling, A.L.; Behm, T.; Klapiszewski, L.; Ambrozewicz, D.; Nowacka, M.; Abendroth, B.; Meyer, D.C.; Kurzydłowski, K.J.; Jesionowski, T.; Ehrlich, H.: An extreme biomimetic approach: hydrothermal synthesis of b-chitin/ZnO nanostructured composites. In: Journal of Materials Chemistry B 1 (2013), S. 6469–6476Vasilev, B.; Bott, S.; Rzehak, R.; Liske, R.; Bartha, J. W.: A method for characterizing the pad surface texture and modeling its impact on the planarization in CMP. In: Microelectronic Engineering 104 (2013), S. 48–57Lotin, A.A.; Novodvorsky, O.A.; Khramova, O.D.; Parshina, L.S.; Lebedev, F.V.; Bartha, J.W.; Wenzel, C.: Influence of growth temperature on physical properties of ZnO films produced by pulsed laser deposition method. In: Optical Materials 35 (2013), Nr. 8, S. 1564–1570Kubasch, C.; Bartha, J.W.: Water uptake of a low-k dielectric film: Combining capacitance and gravimetric measurements. In: Microelectronic Engineering 106 (2013), S. 177–181Knaut, M.; Junige, M.; Neumann, V.; Wojcik, H.; Henke, T.; Hossbach, C.; Hiess, A.; Albert, M.; Bartha, J.W.: Atomic layer deposition for high aspect ratio through silicon vias. In: Microelectronic Engineering 107 (2013), S. 80–83 1 2 3 WeiterDiese Informationen werden vom Vorgängersystem FIS bereitgestellt.