Conferences 51 bis 60 von 428 EinträgenUllrich, H.J.; Huhle, A.; Danczak, M.; Radloff, S.; Geske, V.; Schwarzer, R.; Langer, E.; Däbritz, S.; Modler, N.; Gude, M.; Hufenbach, W.: Unkonventionelle Verfahren der Werkstoffcharakterisierung. In: Proc. 18. Arbeitstagung Angewandte Oberflächenanalytik AOFA18, 29.09.-01.10.2014, Kaiserslautern (2014), S. 123–127Fischer, D. D.; Leszczynska, B.; Albert, M.; Bartha, J. W.; Stephan, U.; Kuske, J.; Prager, N.; Fahland, M.: Development and Investigation of Thin Film Solar Cells on Flexible Substrates Using Very High Frequency Plasma Enhanced Chemical Vapor Deposition (VHF-PECVD) Technique. In: 29th European Photovoltaic Solar Energy Conference and Exhibition, 3DV.4.24, Amsterdam, Netherlands, 22.09.-26.09.2014 (2014), S. 1929–1932Woijcik, H.; Schwiegel, B.; Klaus, C.; Urbansky, N.; Kriz, J.; Hahn, J.; Kubasch, C.; Wenzel, C.; Bartha, J. W.: Cu barrier properties of very thin Ta and TaN films . In: Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International, 20-23 May 2014, San Jose, CA (2014), S. 167–170Hossbach, C.; Fischer, D.; Schramm, T.; Albert, M.; Bartha, J. W.; Singh, A.; Richter, C.; Schröder, U.; Nehm, F.; Klumbies, H.; Müller-Meskamp, L.: Molecular Layer Deposition of Aluminum and Titanium Alkoxide for the Encapsulation of Flexible OLED Devices . In: Baltic Conference on Atomic Layer Deposition 2014 (BALD 2014), Helsinki, Finland; 05/2014 (2014)Schroedter, R.; Janschek, K.; Sandner, T.: Jerk and Current Limited Flatness-based Open Loop Control of Foveation Scanning Electrostatic Micromirrors. In: Proc. of 19th IFAC World Congress, 24-29 August 2014, Cap Town, South Afrika (2014), S. 2685–2690Voigt, A.; Feng, W.; Allerdißen, M.; Pedrero, L.; Richter, A.: Chemical Transistors as a Basis for Chemical Computing. In: Unconventional Computation and Natural Computation 2014, London, Ontario, Canada, Poster Proceedings 28-29 (2014)Junige, M.; Sharma, V.; Schmidt, D.; Albert, M.; Schubert, M.; Bartha, J. W.: Progress in Spectroscopic Ellipsometry for the in-situ real-time investigation of Atomic Layer Depositions. In: 8th Workshop Ellipsometry, Arbeitskreis Paul Drude e. V. in Dresden, 10.-12.03.2014 Vortrag (2014)Müller, M. R.; Künzelmann, U.; Menzel, S.; Petrov, I.; Kallis, K.; Knoch, J.: Tackling Hillocks Growth after Aluminum CMP. In: ICPT 2014 International Conference on Planarization /CMP Technology, Kobe, Japan, November 19-21, 2014 (2014)Marschner, U.; Sauer, S.; Körbitz, R.; Starke, E.; Fischer, W.-J.; Clasbrummel, B.: Model-based Monitoring of Hip Prosthesis Vibrations for Loosening Detection. In: BMT 2014 48th DGBMT ANNUAL CONFERENCE October 8-10, 2014, Hannover (2014), Nr. 59s1Marschner, U.; Pfeifer, G.; Starke, E.: Reciprocity of Linear Systems With Smart Materials Utilized for Precise Measurement Techniques. In: SMASIS2014 September 8-10, 2014, Newport, Rhode Island, USA (2014)Zurück 2 3 4 5 6 7 8 9 10 11 WeiterDiese Informationen werden vom Vorgängersystem FIS bereitgestellt. Conference Archive: 2015 | 2014 | 2013 | 2012 | 2011 | 2010 | 2009 | 2008 | 2007 | 2006 | 2005 | 2004