Publications

2022

• END-TRUE: Emerging Nanotechnology-Based Double-Throughput True Random Number GeneratorRai, S., Gupta, N., Bhattacharjee, A., Rupani, A., Raitza, M., Trommer, J., Mikolajick, T. & 1 others, 2022, VLSI-SoC: Technology Advancement on SoC Design - 29th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, Revised and Extended Selected Papers. Grimblatt, V., Chang, C. H., Chattopadhyay, A., Reis, R. & Calimera, A. (eds.). Springer Science and Business Media B.V., p. 175-203, 29 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Experimental fabrication of an ESF3 floating gate flash cell in an FD-SOI processMika, N., Melde, T., Dunkel, S., Otto, M., Weisbuch, F., Krottenthaler, P. & Mikolajick, T., 2022, ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC). p. 356-359, 4 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Germanium Nanowire Reconfigurable Transistor Model for Predictive Technology EvaluationQuijada, J. N., Baldauf, T., Rai, S., Heinzig, A., Kumar, A., Weber, W. M., Mikolajick, T. & 1 others, 2022, In: IEEE transactions on nanotechnology. 21, p. 728-736, 9 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Improvement of FTJ on-current by work function engineering for massive parallel neuromorphic computingLancaster, S., Duong, Q. T., Covi, E., Mikolajick, T. & Slesazeck, S., 2022, ESSCIRC 2022 - IEEE 48th European Solid State Circuits Conference, Proceedings. Institute of Electrical and Electronics Engineers (IEEE), p. 137-140, 4 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Influence of Interfacial Oxide Layers in Hf_0.5Zr_0.5O₂based ferroelectric capacitors on reliability performanceAlcala, R., Mehmood, F., Vishnumurthy, P., Mittmann, T., Mikolajick, T. & Schroeder, U., 2022, 2022 IEEE International Memory Workshop (IMW). Dresden: Institute of Electrical and Electronics Engineers (IEEE), 4 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Interplay between charge trapping and polarization switching in BEOL-compatible bilayer Ferroelectric Tunnel JunctionsFontanini, R., Barbot, J., Segatto, M., Lancaster, S., Duong, Q., Driussi, F., Grenouillet, L. & 5 others, 2022, In: IEEE journal of the Electron Devices Society. 10, p. 593-599, 7 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Optimizing nucleation layers for the integration of ferroelectric HZO on CVD-grown grapheneLancaster, S., Arnay, I., Guerrero, R., Gudin, A., Mikolajick, T., Perna, P. & Slesazeck, S., 2022, 2022 IEEE International Symposium on Applications of Ferroelectrics (ISAF). Institute of Electrical and Electronics Engineers (IEEE)Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Physics-Based DC Compact Modeling of Schottky Barrier and Reconfigurable Field-Effect TransistorsRoemer, C., Darbandy, G., Schwarz, M., Trommer, J., Heinzig, A., Mikolajick, T., Weber, W. M. & 2 others, 2022, In: IEEE journal of the Electron Devices Society. 10, p. 416-423, 8 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Polarization switching and AC small-signal capacitance in Ferroelectric Tunnel JunctionsSegatto, M., Massarotto, M., Lancaster, S., Duong, Q. T., Affanni, A., Fontanini, R., Driussi, F. & 4 others, 2022, ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference, Proceedings. Editions Frontieres, p. 340-343, 4 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Pushing Sputtered HfO₂-Based Ferroelectrics toward BEOL CompatibilityWang, X., Mikolajick, T. & Grube, M., 2022, 2022 IEEE Nanotechnology Materials and Devices Conference (NMDC). Nanjing: Institute of Electrical and Electronics Engineers (IEEE), p. 21-24, 4 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution