Publications

2021

• Influence of oxygen source on the ferroelectric properties of ALD grown Hf_1-xZr_xO₂filmsAlcala, R., Richter, C., Materano, M., Lomenzo, P. D., Zhou, C., Jones, J. L., Mikolajick, T. & 1 others, Jan 2021, In: Journal of Physics D: Applied Physics. 54, 3, 035102Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Surface Preconditioning and Postmetallization Anneal Improving Interface Properties and V_th Stability under Positive Gate Bias Stress in AlGaN/GaN MIS-HEMTsCalzolaro, A., Szabó, N., Großer, A., Gärtner, J., Mikolajick, T. & Wachowiak, A., Jan 2021, In: Physica Status Solidi (A) Applications and Materials Science. 218, 2, 2000585Electronic (full-text) versionResearch output: Contribution to journal > Research article
• 16kbit HfO₂:Si-based 1T-1C FeRAM Arrays Demonstrating High Performance Operation and Solder Reflow CompatibilityFrancois, T., Coignus, J., Makosiej, A., Giraud, B., Carabasse, C., Barbot, J., Martin, S. & 14 others, 2021, 2021 IEEE International Electron Devices Meeting, IEDM 2021. Institute of Electrical and Electronics Engineers (IEEE), p. 33.1.1-33.1.4Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Back-bias reconfigurable field effect transistor: A flexible add-on functionality for 22 nm FDSOISessi, V., Simon, M., Slesazeck, S., Drescher, M., Mulaosmanovic, H., Li, K., Binder, R. & 13 others, 2021, 2021 Silicon Nanoelectronics Workshop, SNW 2021. Institute of Electrical and Electronics Engineers (IEEE), 2 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Control Strategies to Optimize Graph Coloring via M-CNNs with Locally-Active NbOx MemristorsAscoli, A., Weiher, M., Tetzlaff, R., Herzig, M., Slesazeck, S. & Mikolajick, T., 2021Research output: Contribution to conferences > Paper
• Demonstration of 1T1C FeRAM Arrays for Nonvolatile Memory ApplicationsOkuno, J., Kunihiro, T., Konishi, K., Maemura, H., Shuto, Y., Sugaya, F., Materano, M. & 8 others, 2021, 2021 20th International Workshop on Junction Technology (IWJT). Institute of Electrical and Electronics Engineers (IEEE)Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• FeFET based Logic-in-Memory: an overviewMarchand, C., O’Connor, I., Cantan, M., Breyer, E. T., Slesazeck, S. & Mikolajick, T., 2021, Proceedings - 2021 16th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2021. Institute of Electrical and Electronics Engineers (IEEE), 6 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Ferroelectric Tunneling Junctions for Edge ComputingCovi, E., Duong, Q. T., Lancaster, S., Havel, V., Coignus, J., Barbot, J., Richter, O. & 6 others, 2021, 2021 IEEE International Symposium on Circuits and Systems, ISCAS 2021 - Proceedings. Institute of Electrical and Electronics Engineers (IEEE), 9401800Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Integration and Reliability Aspects of Low-Temperature and Au-free Ta/Al-based Ohmic Contacts for AlGaN/GaN MIS-HEMTsCalzolaro, A., Mikolajick, T. & Wachowiak, A., 2021, ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC). p. 307-310, 4 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Mechanism of Retention Degradation after Endurance Cycling of HfO₂-based Ferroelectric TransistorsZhou, H., Ocker, J., Pesic, M., Padovani, A., Trentzsch, M., Dünkel, S., Müller, J. & 5 others, 2021, 2021 Symposium on VLSI Technology. Kyoto: Institute of Electrical and Electronics Engineers (IEEE)Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution