Publications
669 Entries
2020
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Magnetic and ferroelectric memories, 1 Jan 2020, Memristive Devices for Brain-Inspired Computing: From Materials, Devices, and Circuits to Applications - Computational Memory, Deep Learning, and Spiking Neural Networks. Elsevier , p. 97-134, 38 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Chapter in book/Anthology/Report
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A Silicon Nanowire Ferroelectric Field-Effect Transistor, 2020, In: Advanced electronic materials. 6, 4, p. 1901244, 1 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
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Compact FeFET Circuit Building Blocks for Fast and Efficient Nonvolatile Logic-in-Memory, 2020, In: IEEE journal of the Electron Devices Society. 8, p. 748-756Electronic (full-text) versionResearch output: Contribution to journal > Research article
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FeFETs for Neuromorphic Systems, 2020, Topics in Applied Physics. Springer, p. 399-411, 13 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Chapter in book/Anthology/Report
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Flexible memory, bit-passing and mixed logic/ memory operation of two intercoupled FeFET arrays, 2020, IEEE International Symposium on Circuits and Systems (ISCAS). Institute of Electrical and Electronics Engineers (IEEE), 9181279Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Nonvolatile Field-Effect Transistors Using Ferroelectric-Doped HfO2 Films, 2020, Ferroelectric-Gate Field Effect Transistor Memories: Device Physics and Applications. 2 ed., Springer, p. 79-96, 18 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Chapter in book/Anthology/Report
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Quantitative Characterization of Reconfigurable Transistor Logic Gates., 2020, In: IEEE access. 8, p. 112598-112614, 17 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
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Reliability improvement of ferroelectric hf0.5zr0.5o2 thin films by lanthanum doping for feram applications, 2020Electronic (full-text) versionResearch output: Contribution to conferences > Paper
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Review of defect chemistry in fluorite-structure ferroelectrics for future electronic devices, 2020, In: Journal of Materials Chemistry. C, Materials for optical and electronic devices. 8, 31, p. 10526-10550, 25 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
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SOTF-BTI - An S-parameters based on-the-fly bias temperature instability characterization method, 2020Electronic (full-text) versionResearch output: Contribution to conferences > Paper