Publications
675 Entries
2019
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Direct Correlation of Ferroelectric Properties and Memory Characteristics in Ferroelectric Tunnel Junctions, 2019, In: IEEE journal of the Electron Devices Society. 7, 1, p. 1175-1181Electronic (full-text) versionResearch output: Contribution to journal > Research article
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Ferroelectric FETs With 20-nm-Thick HfO₂ Layer for Large Memory Window and High Performance, 2019, In: IEEE transactions on electron devices : ED. 66, 9, p. 3828-3833, 6 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
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Ferroelectric Hf1-xZrxO2 Memories: Device Reliability and Depolarization Fields, 2019, 2019 19th Non-Volatile Memory Technology Symposium (NVMTS), Durham, NC, USA. p. 1-8Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Next Generation Ferroelectric Memories enabled by Hafnium Oxide, 2019, 2018 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)Research output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Recent progress for obtaining the ferroelectric phase in hafnium oxide based films: Impact of oxygen and zirconium, 2019, In: Japanese journal of applied physics. 58, SL, SL0801Electronic (full-text) versionResearch output: Contribution to journal > Research article
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Towards Reconfigurable Electronics: Silicidation of Top-Down Fabricated Silicon Nanowires, 2019, In: Applied Sciences. 9, 17, p. 3462, 1 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
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Unveiling the double-well energy landscape in a ferroelectric layer, 2019, In: Nature. 565, p. 464–467Electronic (full-text) versionResearch output: Contribution to journal > Research article
2018
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Green coloring of GaN single crystals introduced by Cr impurity, 24 Nov 2018, In: Journal of luminescence. 207, p. 507-511, 5 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
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Characterization of self-assembled monolayers for Cu-Cu bonding technology, 16 Oct 2018, In: Microelectronic Engineering. 202, p. 19-24, 6 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
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Ferroelectric tunnel junctions based on ferroelectric-dielectric Hf0.5Zr0.5.O2/A12O3 capacitor stacks, 8 Oct 2018, 2018 48th European Solid-State Device Research Conference, ESSDERC 2018. Editions Frontieres, p. 142-145, 4 p., 8486882Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution