Publications

2019

• Unveiling the double-well energy landscape in a ferroelectric layerHoffmann, M., Fengler, F., Herzig, M., Mittmann, T., Max, B., Schroeder, U., Negrea, R. & 3 others, 2019, In: Nature. 565, p. 464–467Electronic (full-text) versionResearch output: Contribution to journal > Research article

2018

• Green coloring of GaN single crystals introduced by Cr impurityZimmermann, F., Gärtner, G., Sträter, H., Röder, C., Barchuk, M., Bastin, D., Hofmann, P. & 4 others, 24 Nov 2018, In: Journal of luminescence. 207, p. 507-511, 5 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Characterization of self-assembled monolayers for Cu-Cu bonding technologyLykova, M., Langer, E., Hinrichs, K., Panchenko, J., Meyer, J., Künzelmann, U., Wolf, M. J. & 1 others, 16 Oct 2018, In: Microelectronic Engineering. 202, p. 19-24, 6 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Ferroelectric tunnel junctions based on ferroelectric-dielectric Hf_0.5Zr_0.5.O₂/A1₂O₃ capacitor stacksMax, B., Hoffmann, M., Slesazeck, S. & Mikolajick, T., 8 Oct 2018, 2018 48th European Solid-State Device Research Conference, ESSDERC 2018. Editions Frontieres, p. 142-145, 4 p., 8486882Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Off-state impact on FDSOI ring oscillator degradation under high voltage stressTrommer, J., Havel, V., Chohan, T., Mehmood, F., Slesazeck, S., Krause, G., Bossu, G. & 3 others, Oct 2018, 2018 IEEE International Integrated Reliability Workshop (IIRW). Institute of Electrical and Electronics Engineers (IEEE), Vol. 2018. 5 p., 8727101Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• A wired-AND transistor: Polarity controllable FET with multiple inputsSimon, M., Trommer, J., Liang, B., Fischer, D., Baldauf, T., Khan, M. B., Heinzig, A. & 6 others, 20 Aug 2018, 2018 76th Device Research Conference, DRC 2018. Institute of Electrical and Electronics Engineers (IEEE), 8442159Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Genuinely Ferroelectric Sub-1-Volt-Switchable Nanodomains in HfxZr(1–x)O2 Ultrathin CapacitorsStolichnov, I., Cavalieri, M., Colla, E., Schenk, T., Mittmann, T., Mikolajick, T., Schroeder, U. & 1 others, 14 Aug 2018, In: ACS applied materials & interfaces. 10, 36, p. 30514–30521, 8 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Vertically Integrated Reconfigurable Nanowire ArraysBaldauf, T., Heinzig, A., Mikolajick, T. & Weber, W. M., Aug 2018, In: IEEE electron device letters. 39, 8, p. 1242 - 1245Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Electron spin resonance in a 2D system at a GaN/AlGaN heterojunctionShchepetilnikov, A. V., Frolov, D. D., Solovyev, V. V., Nefyodov, Y. A., Großer, A., Mikolajick, T., Schmult, S. & 1 others, 30 Jul 2018, In: Applied physics letters. 113, 5, 052102Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Comparative Study of Reliability of Ferroelectric and Anti-Ferroelectric MemoriesPesic, M., Schroeder, U., Slesazeck, S. & Mikolajick, T., Jun 2018, In: IEEE transactions on device and materials reliability. 18, 2, p. 154-162, 9 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article