Publications

2018

• Comparative Study of Reliability of Ferroelectric and Anti-Ferroelectric MemoriesPesic, M., Schroeder, U., Slesazeck, S. & Mikolajick, T., Jun 2018, In: IEEE transactions on device and materials reliability. 18, 2, p. 154-162, 9 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Nanoscopic studies of domain structure dynamics in ferroelectric La:HfO2 capacitorsBuragohain, P., Richter, C., Schenk, T., Lu, H., Mikolajick, T., Schroeder, U. & Gruverman, A., 28 May 2018, In: Applied physics letters. 112, 22, 222901 Electronic (full-text) versionResearch output: Contribution to journal > Research article
• On the relationship between field cycling and imprint in ferroelectric Hf0.5Zr0.5O2Fengler, F. P. G., Hoffmann, M., Slesazeck, S., Mikolajick, T. & Schroeder, U., 28 May 2018, In: Journal of applied physics. 123, 20, 204101 Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Ferroelectric negative capacitance domain dynamicsHoffmann, M., Khan, A. I., Serrao, C., Lu, Z., Salahuddin, S., Pešić, M., Slesazeck, S. & 2 others, 14 May 2018, In: Journal of applied physics. 123, 18, 184101Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Al-, Y-, and La-doping effects favoring intrinsic and field induced ferroelectricity in HfO2: A first principles studyMaterlik, R., Künneth, C., Falkowski, M., Mikolajick, T. & Kersch, A., 28 Apr 2018, In: Journal of applied physics. 123, 164101Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Interplay between ferroelectric and resistive switching in doped crystalline HfO2Max, B., Pesic, M., Slesazeck, S. & Mikolajick, T., 7 Apr 2018, In: Journal of applied physics. 123, 13Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Pyroelectricity of silicon-doped hafnium oxide thin filmsJachalke, S., Schenk, T., Park, M. H., Schroeder, U., Mikolajick, T., Stöcker, H., Mehner, E. & 1 others, 2 Apr 2018, In: Applied physics letters. 112, 142901Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Lanthanum-Doped Hafnium Oxide: A Robust Ferroelectric MaterialSchroeder, U., Richter, C., Park, M. H., Schenk, T., Pesic, M., Hoffmann, M., Fengler, F. P. G. & 6 others, 5 Mar 2018, In: Inorganic chemistry. 57, 5, p. 2752-2765, 14 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Analysis of Performance Instabilities of Hafnia‐Based Ferroelectrics Using Modulus Spectroscopy and Thermally Stimulated Depolarization CurrentsFengler, F. P. G., Nigon, R., Muralt, P., Grimley, E. D., Sang, X., Sessi, V., Hentschel, R. & 3 others, 1 Mar 2018, In: Advanced electronic materials. 4, 3, 1700547Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Signal and Noise of Schottky-Junction Parallel Silicon Nanowire Transducers for Biochemical SensingPregl, S., Baraban, L., Sessi, V., Mikolajick, T., Weber, W. M. & Cuniberti, G., 1 Feb 2018, In: IEEE sensors journal. 18, 3, p. 967 - 975, 9 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article