Publications

2018

• Off-state impact on FDSOI ring oscillator degradation under high voltage stressTrommer, J., Havel, V., Chohan, T., Mehmood, F., Slesazeck, S., Krause, G., Bossu, G. & 3 others, Oct 2018, 2018 IEEE International Integrated Reliability Workshop (IIRW). Institute of Electrical and Electronics Engineers (IEEE), Vol. 2018. 5 p., 8727101Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• A wired-AND transistor: Polarity controllable FET with multiple inputsSimon, M., Trommer, J., Liang, B., Fischer, D., Baldauf, T., Khan, M. B., Heinzig, A. & 6 others, 20 Aug 2018, 2018 76th Device Research Conference, DRC 2018. Institute of Electrical and Electronics Engineers (IEEE), 8442159Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Genuinely Ferroelectric Sub-1-Volt-Switchable Nanodomains in HfxZr(1–x)O2 Ultrathin CapacitorsStolichnov, I., Cavalieri, M., Colla, E., Schenk, T., Mittmann, T., Mikolajick, T., Schroeder, U. & 1 others, 14 Aug 2018, In: ACS applied materials & interfaces. 10, 36, p. 30514–30521, 8 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Vertically Integrated Reconfigurable Nanowire ArraysBaldauf, T., Heinzig, A., Mikolajick, T. & Weber, W. M., Aug 2018, In: IEEE electron device letters. 39, 8, p. 1242 - 1245Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Electron spin resonance in a 2D system at a GaN/AlGaN heterojunctionShchepetilnikov, A. V., Frolov, D. D., Solovyev, V. V., Nefyodov, Y. A., Großer, A., Mikolajick, T., Schmult, S. & 1 others, 30 Jul 2018, In: Applied physics letters. 113, 5, 052102Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Comparative Study of Reliability of Ferroelectric and Anti-Ferroelectric MemoriesPesic, M., Schroeder, U., Slesazeck, S. & Mikolajick, T., Jun 2018, In: IEEE transactions on device and materials reliability. 18, 2, p. 154-162, 9 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Nanoscopic studies of domain structure dynamics in ferroelectric La:HfO2 capacitorsBuragohain, P., Richter, C., Schenk, T., Lu, H., Mikolajick, T., Schroeder, U. & Gruverman, A., 28 May 2018, In: Applied physics letters. 112, 22, 222901 Electronic (full-text) versionResearch output: Contribution to journal > Research article
• On the relationship between field cycling and imprint in ferroelectric Hf0.5Zr0.5O2Fengler, F. P. G., Hoffmann, M., Slesazeck, S., Mikolajick, T. & Schroeder, U., 28 May 2018, In: Journal of applied physics. 123, 20, 204101 Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Ferroelectric negative capacitance domain dynamicsHoffmann, M., Khan, A. I., Serrao, C., Lu, Z., Salahuddin, S., Pešić, M., Slesazeck, S. & 2 others, 14 May 2018, In: Journal of applied physics. 123, 18, 184101Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Al-, Y-, and La-doping effects favoring intrinsic and field induced ferroelectricity in HfO2: A first principles studyMaterlik, R., Künneth, C., Falkowski, M., Mikolajick, T. & Kersch, A., 28 Apr 2018, In: Journal of applied physics. 123, 164101Electronic (full-text) versionResearch output: Contribution to journal > Research article