Publications

2017

• Enabling energy efficiency and polarity control in germanium nanowire transistors by individually gated nanojunctionsTrommer, J., Heinzig, A., Muhle, U., Löffler, M., Winzer, A., Jordan, P. M., Beister, J. & 6 others, 2017, In: ACS nano. 11, 2, p. 1704-1711, 8 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Exploiting transistor-level reconfiguration to optimize combinational circuitsRaitza, M., Kumar, A., Völp, M., Walter, D., Trommer, J., Mikolajick, T. & Weber, W., 2017, Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• How to make DRAM non-volatile? Anti-ferroelectrics: A new paradigm for universal memoriesPesic, M., Knebel, S., Hoffmann, M., Richter, C., Mikolajick, T. & Schroeder, U., 2017, Technical Digest - International Electron Devices Meeting, IEDMElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Human α-thrombin detection platform using aptamers on a silicon nanowire field-effect transistorRoemhildt, L., Zoergiebel, F., Ibarlucea, B., Vahdatzadeh, M., Baraban, L., Cuniberti, G., Pregl, S. & 3 others, 2017, 2017 27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS). Institute of Electrical and Electronics Engineers (IEEE), p. 1-4Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• In-depth electrical characterization of carrier transport in ambipolar Si-NW Schottky-barrier FETsJeon, D., Baldau, T., Park, S., Pregi, S., Baraban, L., Cuniberti, G., Mikolajick, T. & 1 others, 2017, European Solid-State Device Research ConferenceElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Modeling and design considerations for negative capacitance field-effect transistorsHoffmann, M., Pešić, M., Slesazeck, S., Schroeder, U. & Mikolajick, T., 2017, Joint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017 - ProceedingsElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Novel ferroelectric FET based synapse for neuromorphic systemsMulaosmanovic, H., Ocker, J., Muller, S., Noack, M., Muller, J., Polakowski, P., Mikolajick, T. & 1 others, 2017, Digest of Technical Papers - Symposium on VLSI TechnologyElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Optimizing process conditions for improved Hf_1 − xZrxO₂ ferroelectric capacitor performanceMittmann, T., Fengler, F., Richter, C., Park, M. H., Mikolajick, T. & Schroeder, U., 2017, In: Microelectronic Engineering. 178, p. 48-51, 4 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Pseudo-vertical GaN-based trench gate metal oxide semiconductor field effect transistorHentschel, R., Wachowiak, A., Großer, A., Jahn, A., Merkel, U., Wille, A., Kalisch, H. & 3 others, 2017, ASDAM 2016 - Conference Proceedings, 11th International Conference on Advanced Semiconductor Devices and MicrosystemsElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Reliability comparison of ZrO₂-based DRAM high-k dielectrics under DC and AC stressKnebel, S., Zhou, D., Schroeder, U., Slesazeck, S., Pešíc, M., Agaiby, R., Heitmann, J. & 1 others, 2017, In: IEEE transactions on device and materials reliability. 17, 2, p. 324 - 330Electronic (full-text) versionResearch output: Contribution to journal > Research article