Publications
690 Entries
2017
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How to make DRAM non-volatile? Anti-ferroelectrics: A new paradigm for universal memories, 2017, Technical Digest - International Electron Devices Meeting, IEDMElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Human α-thrombin detection platform using aptamers on a silicon nanowire field-effect transistor, 2017, 2017 27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS). Institute of Electrical and Electronics Engineers (IEEE), p. 1-4Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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In-depth electrical characterization of carrier transport in ambipolar Si-NW Schottky-barrier FETs, 2017, European Solid-State Device Research ConferenceElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Modeling and design considerations for negative capacitance field-effect transistors, 2017, Joint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017 - Proceedings. 4 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Novel ferroelectric FET based synapse for neuromorphic systems, 2017, Digest of Technical Papers - Symposium on VLSI TechnologyElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Optimizing process conditions for improved Hf1 − xZrxO2 ferroelectric capacitor performance, 2017, In: Microelectronic Engineering. 178, p. 48-51, 4 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
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Pseudo-vertical GaN-based trench gate metal oxide semiconductor field effect transistor, 2017, ASDAM 2016 - Conference Proceedings, 11th International Conference on Advanced Semiconductor Devices and MicrosystemsElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Reliability comparison of ZrO2-based DRAM high-k dielectrics under DC and AC stress, 2017, In: IEEE transactions on device and materials reliability. 17, 2, p. 324 - 330Electronic (full-text) versionResearch output: Contribution to journal > Research article
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Surface and grain boundary energy as the key enabler of ferroelectricity in nanoscale hafnia-zirconia: a comparison of model and experiment, 2017, In: Nanoscale. 9, 28, p. 9973-9986, 14 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
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The RFET - A reconfigurable nanowire transistor and its application to novel electronic circuits and systems, 2017, In: Semiconductor science and technology. 32, 4, 043001Electronic (full-text) versionResearch output: Contribution to journal > Research article