Publications

2016

• Root cause of degradation in novel HfO2-based ferroelectric memoriesPesic, M., Fengler, F., Slesazeck, S., Schroeder, U., Mikolajick, T., Larcher, L. & Padovani, A., 2016, 2016 IEEE International Reliability Physics Symposium Proceedings. Institute of Electrical and Electronics Engineers (IEEE)Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Strain-engineering for improved tunneling in reconfigurable silicon nanowire transistorsBaldauf, T., Heinzig, A., Mikolajick, T., Weber, W. & Trommer, J., 2016, 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2016Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• TEM Study of Schottky Junctions in Reconfigurable Silicon Nanowire DevicesBanerjee, S., Löffler, M., Muehle, U., Berent, K., Heinzig, A., Trommer, J., Weber, W. & 1 others, 2016, In: Advanced engineering materials. 18, 2, p. 180-184, 5 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Versatile resistive switching in niobium oxideMikolajick, T., Wylezich, H., Maehne, H. & Slesazeck, S., 2016, 2016 IEEE International Symposium on Circuits and Systems (ISCAS). Institute of Electrical and Electronics Engineers (IEEE), p. 381-384, 4 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution

2015

• ALD Al2O3 based nanolaminates for solar cell applicationsSimon, D. K., Jordan, P. M., Knaut, M., Chohan, T., Mikolajick, T. & Dirnstorfer, I., 14 Dec 2015, 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015. Institute of Electrical and Electronics Engineers (IEEE), 7356401Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Using vertical capacitance-voltage measurements for fast on-wafer characterization of epitaxial GaN-on-Si materialSchuster, M., Wachowiak, A., Groh, L., Szabõ, N., Merkel, U., Jahn, A. & Mikolajick, T., 1 Dec 2015, In: Physica Status Solidi (A) Applications and Materials Science. 212, 12, p. 2897-2902, 6 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Investigation of band gap and permittivity of the perovskite CaTiO3 in ultrathin layersKrause, A., Weber, W. M., Pohl, D., Rellinghaus, B., Kersch, A. & Mikolajick, T., 21 Oct 2015, In: Journal Physics D: Applied Physics. 48, 41Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Breakdown and Protection of ALD Moisture Barrier Thin FilmsNehm, F., Klumbies, H., Richter, C., Singh, A., Schroeder, U., Mikolajick, T., Moench, T. & 5 others, 14 Oct 2015, In: ACS applied materials & interfaces. 7, 40, p. 22121-22127, 7 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Integration of niobium oxide-based resistive switching cells with different select properties into nanostructured cross-bar arraysWylezich, H., Reinhardt, E., Slesazeck, S. & Mikolajick, T., 9 Oct 2015, In: Semiconductor science and technology. 30, 11, 115014Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Stress-Dependent Performance Optimization of Reconfigurable Silicon Nanowire TransistorsBaldauf, T., Heinzig, A., Trommer, J., Mikolajick, T. & Weber, W. M., Oct 2015, In: IEEE electron device letters. 36, 10, p. 991-993, 3 p., 7217784Electronic (full-text) versionResearch output: Contribution to journal > Research article