Publications

2015

• Stress-Dependent Performance Optimization of Reconfigurable Silicon Nanowire TransistorsBaldauf, T., Heinzig, A., Trommer, J., Mikolajick, T. & Weber, W. M., Oct 2015, In: IEEE electron device letters. 36, 10, p. 991-993, 3 p., 7217784Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Detailed analysis of oxide related charges and metal-oxide barriers in terrace etched Al2O3 and HfO2 on AlGaN/GaN heterostructure capacitorsWinzer, A., Szabó, N., Ocker, J., Hentschel, R., Schuster, M., Schubert, F., Gärtner, J. & 2 others, 25 Sep 2015, In: Journal of applied physics. 118, 12, 124106 Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Energy monitoring of high dose ion implantation in semiconductors via photocurrent measurementEichenseer, C., Poeppel, G. & Mikolajick, T., Aug 2015, In: Microelectronics Reliability. 55, 9-10, p. 1369-1372, 4 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Stability analysis supports memristor circuit designAscoli, A., Tetzlaff, R., Slesazeck, S., Mahne, H. & Mikolajick, T., 27 Jul 2015, 2015 IEEE International Symposium on Circuits and Systems (ISCAS). Institute of Electrical and Electronics Engineers (IEEE), p. 1138-1141, 4 p., 7168839Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Scaling and Graphical Transport-Map Analysis of Ambipolar Schottky-Barrier Thin-Film Transistors Based on a Parallel Array of Si NanowiresJeon, D. Y., Pregl, S., Park, S. J., Baraban, L., Cuniberti, G., Mikolajick, T. & Weber, W. M., 8 Jul 2015, In: Nano letters. 15, 7, p. 4578-4584, 7 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Light Weight and Flexible High-Performance Diagnostic PlatformKarnaushenko, D., Ibarlucea, B., Lee, S., Lin, G., Baraban, L., Pregl, S., Melzer, M. & 5 others, Jul 2015, In: Advanced healthcare materials. 4, 10, p. 1517-1525, 9 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Effect of the stoichiometry of niobium oxide on the resistive switching of Nb₂O₅ based metal-insulator-metal stacksHanzig, F., Mähne, H., Veselý, J., Wylezich, H., Slesazeck, S., Leuteritz, A., Zschornak, M. & 4 others, 23 Jun 2015, In: Journal of electron spectroscopy and related phenomena. 202, p. 122-127, 6 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Ultra-thin ZrO₂/SrO/ZrO₂ insulating stacks for future dynamic random access memory capacitor applicationsKnebel, S., Pešić, M., Cho, K., Chang, J., Lim, H., Kolomiiets, N., Afanas'Ev, V. V. & 3 others, 14 Jun 2015, In: Journal of applied physics. 117, 22, 224102Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Functionality-Enhanced Logic Gate Design Enabled by Symmetrical Reconfigurable Silicon Nanowire TransistorsTrommer, J., Heinzig, A., Baldauf, T., Slesazeck, S., Mikolajick, T. & Weber, W., 8 May 2015, In: IEEE transactions on nanotechnology. 14, 4, p. 689 - 698, 9 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Experimental proof of the drain-side dielectric breakdown of HKMG nMOSFETs under logic circuit operationKupke, S., Knebel, S., Ocker, J., Slesazeck, S., Agaiby, R., Trentzsch, M. & Mikolajick, T., 1 May 2015, In: IEEE electron device letters. 36, 5, p. 430-432, 3 p., 7058394Electronic (full-text) versionResearch output: Contribution to journal > Research article