Publications

2015

• Optoelectronic switching of nanowire-based hybrid organic/oxide/semiconductor field-effect transistorsBaek, E., Pregl, S., Shaygan, M., Römhildt, L., Weber, W. M., Mikolajick, T., Ryndyk, D. A. & 2 others, 1 Apr 2015, In: Nano research. 8, 4, p. 1229-1240, 12 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Effect of independently sized gates on the delay of reconfigurable silicon nanowire transistor based circuitsTrommer, J., Slesazeck, S., Weber, W. M., Heinzig, A., Baldauf, T. & Mikolajick, T., 18 Mar 2015, EUROSOI-ULIS 2015 - 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon. Institute of Electrical and Electronics Engineers (IEEE), p. 17-20, 4 p., 7063762Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Ferroelectric hafnium oxideMuller, J., Polakowski, P., Riedel, S., Mueller, S., Yurchuk, E. & Mikolajick, T., 13 Mar 2015, 2014 14th Annual Non-Volatile Memory Technology Symposium, NVMTS 2014. Institute of Electrical and Electronics Engineers (IEEE), 7060838Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Correspondence - Dynamic leakage current compensation revisitedSchenk, T., Schroeder, U. & Mikolajick, T., Mar 2015, In: IEEE transactions on ultrasonics, ferroelectrics, and frequency control. 62, 3, p. 596-599, 4 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Defect generation and activation processes in HfO₂ thin films: Contributions to stress-induced leakage currentsÖttking, R., Kupke, S., Nadimi, E., Leitsmann, R., Lazarevic, F., Plänitz, P., Roll, G. & 3 others, Mar 2015, In: Physica Status Solidi (A) Applications and Materials Science. 212, 3, p. 547-553, 7 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• BiasMDP: Carrier lifetime characterization technique with applied bias voltageJordan, P. M., Simon, D. K., Mikolajick, T. & Dirnstorfer, I., 9 Feb 2015, In: Applied physics letters. 106, 6, 061602Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Thickness dependent barrier performance of permeation barriers made from atomic layer deposited alumina for organic devicesKlumbies, H., Schmidt, P., Haehnel, M., Singh, A., Schroeder, U., Richter, C., Mikolajick, T. & 5 others, Feb 2015, In: Organic electronics. 17, p. 138-143Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Integration of molecular-layer-deposited aluminum alkoxide interlayers into inorganic nanolaminate barriers for encapsulation of organic electronics with improved stress resistanceHossbach, C., Nehm, F., Singh, A., Klumbies, H., Fischer, D., Richter, C., Schroeder, U. & 5 others, Jan 2015, In:  Journal of vacuum science & technology : JVST ; A, Vacuum, surfaces, and films. 33, 1, 01A119Electronic (full-text) versionResearch output: Contribution to journal > Research article
• 2D Mapping of Chemical and Field Effect Passivation of Al₂O₃ on Silicon SubstratesJordan, P. M., Simon, D. K., Fengler, F. P., Mikolajick, T. & Dirnstorfer, I., 2015, In: Energy Procedia. 77, p. 91-98, 8 p.Electronic (full-text) versionResearch output: Contribution to journal > Conference article
• Comparison of silicon nanowire growth on SiO₂ and on carbon substratesKrause, A., Grube, M., Mikolajick, T. & Weber, W. M., 2015, 16th International Conference on Advanced Batteries, Accumulators and Fuel Cells, ABAF 2015. Simonova, L. & Vondrak, J. (eds.). 1 ed., Electrochemical Society, Inc., p. 69-78, 10 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution