Publications

2015

• Low-thermal budget flash light annealing for Al₂O₃ surface passivationSimon, D., Henke, T., Jordan, P., Fengler, F., Mikolajick, T., Bartha, J. & Dirnstorfer, I., 2015, In: Physica Status Solidi - Rapid Research Letters. 9, 11, p. 631-635, 5 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Microfluidic alignment and trapping of 1D nanostructures-a simple fabrication route for single-nanowire field effect transistorsGang, A., Haustein, N., Baraban, L., Weber, W., Mikolajick, T., Thiele, J. & Cuniberti, G., 2015, In: RSC advances. 5, p. 94702-94706Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Mobility Investigations on Strained 30-nm High-k Metal Gate MOSFETs by Geometrical Magnetoresistance EffectBeister, J., Wachowiak, A., Boschke, R., Herrmann, T., Uhlarz, M. & Mikolajick, T., 2015, In: IEEE transactions on electron devices : ED. 62, 6, p. 1819 - 1925Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Neue Materialien und Zellkonzepte für Lithium-Schwefel-BatterienDörfler, S., Piwko, M., Strubel, P., Wisser, F. M., Althues, H., Kaskel, S., Schädlich, S. & 16 others, 2015Research output: Contribution to conferences > Paper
• Next-generation ferroelectric memories based on FE-HfO₂Mueller, S., Slesazeck, S., Mikolajick, T., Müller, J., Polakowski, P. & Flachowsky, S., 2015, 2015 Joint IEEE International Symposium on the Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop, ISAF/ISIF/PFM 2015Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• On the Control of the Fixed Charge Densities in Al₂O₃-Based Silicon Surface Passivation SchemesSimon, D., Jordan, P., Mikolajick, T. & Dirnstorfer, I., 2015, In: ACS Applied Materials and Interfaces. 7, 51, p. 28215–28222, 8 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• On the voltage scaling potential of SONOS non-volatile memory transistorsOcker, J., Slesazeck, S., Mikolajick, T., Buschbeck, S., Gunther, S., Yurchuk, E., Hoffmann, R. & 1 others, 2015, European Solid-State Device Research ConferenceElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Physical model of threshold switching in NbO₂ based memristorsSlesazeck, S., Mähne, H., Wylezich, H., Wachowiak, A., Radhakrishnan, J., Ascoli, A., Tetzlaff, R. & 1 others, 2015, In: RSC advances. 5, 124, p. 102318-102322, 5 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Polycrystalline silicon gate originated CMOS device failure investigated by Scanning Spreading Resistance MicroscopyDoering, S., Wachowiak, A., Rochel, M., Nowak, C., Hoffmann, M., Winkler, U., Richter, M. & 3 others, 2015, In: Microelectronic Engineering. 142, p. 40-46Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Preparation and characterization of silicon nanowires using SEM/FIB and TEMBanerjee, S., Muehle, U., Löffler, M., Heinzig, A., Trommer, J. & Zschech, E., 2015, In: International journal of materials research : IJMR. 106, 7, p. 697-702, 6 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article