Publications

2014

• The degradation process of high-k SiO₂/HfO₂ gate-stacks: A combined experimental and first principles investigationNadimi, E., Roll, G., Kupke, S., Öttking, R., Plänitz, P., Radehaus, C., Schreiber, M. & 5 others, May 2014, In: IEEE transactions on electron devices : ED. 61, 5, p. 1278-1283, 6 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Conduction mechanisms and breakdown characteristics of Al₂O ₃-doped ZrO₂ high-k dielectrics for three-dimensional stacked metal-insulator-metal capacitorsKnebel, S., Schroeder, U., Zhou, D., Mikolajick, T. & Krautheim, G., Mar 2014, In: IEEE transactions on device and materials reliability. 14, 1, p. 154-160, 7 p., 6215028Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Influence of substrate quality on structural properties of AlGaN/GaN superlattices grown by molecular beam epitaxySchubert, F., Merkel, U., Mikolajick, T. & Schmult, S., 28 Feb 2014, In: Journal of applied physics. 115, 8, 083511Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Exploiting memristive BiFeO3 bilayer structures for compact sequential logicsYou, T., Shuai, Y., Luo, W., Du, N., Bürger, D., Skorupa, I., Hübner, R. & 6 others, 24 Feb 2014, In: Advanced Functional Materials. 24, 22, p. 3357-3365, 9 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Schottky barrier-based silicon nanowire pH sensor with live sensitivity controlZörgiebel, F. M., Pregl, S., Römhildt, L., Opitz, J., Weber, W., Mikolajick, T., Baraban, L. & 1 others, Feb 2014, In: Nano research. 7, 2, p. 263-271, 9 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• About the deformation of ferroelectric hysteresesSchenk, T., Yurchuk, E., Mueller, S., Schroeder, U., Starschich, S., Boettger, U. & Mikolajick, T., 2014, In: Applied Physics Reviews. 1, 4, 041103Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Analog resistive switching behavior of Al/Nb₂O₅/Al deviceMähne, H., Wylezich, H., Hanzig, F., Slesazeck, S., Rafaja, D. & Mikolajick, T., 2014, In: Semiconductor science and technology. 29, 10, 104002Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Dynamic off-state TDDB of ultra short channel HKMG nFETS and its implications on CMOS logic reliabilityKupke, S., Knebel, S., Rahman, S., Slesazeck, S., Mikolajick, T., Agaiby, R. & Trentzsch, M., 2014, 2014 IEEE International Reliability Physics Symposium, IRPS 2014. Institute of Electrical and Electronics Engineers (IEEE), p. 5B.1.1-5B.1.6, 6860661Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Electric field cycling behavior of ferroelectric hafnium oxideSchenk, T., Schroeder, U., Pešić, M., Popovici, M., Pershin, Y. & Mikolajick, T., 2014, In: ACS Applied Materials and Interfaces. 6, 22, p. 19744–19751, 8 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Ferroelectric hafnium oxide based materials and devices: Assessment of current status and future prospectsMüller, J., Polakowski, P., Mueller, S. & Mikolajick, T., 2014, ECS Transactions. 8 ed., Vol. 64. p. 159-168Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution