Publications

2014

• Ferroelectricity in Si-doped HfO₂ revealed: A binary lead-free ferroelectricMartin, D., Müller, J., Schenk, T., Arruda, T. M., Kumar, A., Strelcov, E., Yurchuk, E. & 5 others, 2014, In: Advanced materials. 26, 48, p. 8198-8202, 5 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Film properties of low temperature HfO2 grown with H 2O, O3, or remote O2-plasmaRichter, C., Schenk, T., Schroeder, U. & Mikolajick, T., 2014, In:  Journal of vacuum science & technology : JVST ; A, Vacuum, surfaces, and films. 32, 1, 01A117 Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Impact of different dopants on the switching properties of ferroelectric hafniumoxideSchroeder, U., Yurchuk, E., Müller, J., Martin, D., Schenk, T., Polakowski, P., Adelmann, C. & 3 others, 2014, In: Japanese journal of applied physics. 53, 8S1, 08LE02Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Influence of nitrogen trap states on the electronic properties of high-k metal gate transistorsOcker, J., Kupke, S., Slesazeck, S., Mikolajick, T., Erben, E., Drescher, M., Naumann, A. & 2 others, 2014, 2014 IEEE International Workshop Integrated Reliability IIRW. Institute of Electrical and Electronics Engineers (IEEE), p. 86-89, 4 p., 7049517Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• In-Situ Investigations of Individual Nanowires within a FIB/SEM SystemLöffler, M., Banerjee, S., Trommer, J., Heinzig, A., Weber, W. & Zschech, E., 2014, Microscopy and Microanalysis. Vol. 20. p. 360-361, 2 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Ionic effects on the transport characteristics of nanowire-based FETs in a liquid environmentNozaki, D., Kunstmann, J., Zörgiebel, F., Pregl, S., Baraban, L., Weber, W., Mikolajick, T. & 1 others, 2014, In: Nano Research. 7, p. 380–389, 10 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Localization of temperature sensitive areas on analog circuitsEichenseer, C., Pöppel, G. & Mikolajick, T., 2014, In: Microelectronics Journal. 45, 6, p. 734-739Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Material prospects of reconfigurable transistor (RFETs) - From silicon to germanium nanowiresTrommer, J., Heinzig, A., Heinrich, A., Jordan, P., Grube, M., Slesazeck, S., Mikolajick, T. & 1 others, 2014, Materials Research Society Symposium ProceedingsElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Origin of the endurance degradation in the novel HfO₂-based 1T ferroelectric non-volatile memoriesYurchuk, E., Mueller, S., Martin, D., Slesazeck, S., Schroeder, U., Mikolajick, T., Muller, J. & 7 others, 2014, 2014 IEEE International Reliability Physics Symposium Proceedings, IRPS 2014Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Photomask CD and LER characterization using Mueller matrix spectroscopic ellipsometryHeinrich, A., Dirnstorfer, I., Bischoff, J., Meiner, K., Ketelsen, H., Richter, U. & Mikolajick, T., 2014, Proceedings of SPIE - The International Society for Optical EngineeringElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution