Publications

2014

• Ionic effects on the transport characteristics of nanowire-based FETs in a liquid environmentNozaki, D., Kunstmann, J., Zörgiebel, F., Pregl, S., Baraban, L., Weber, W., Mikolajick, T. & 1 others, 2014, In: Nano Research. 7, p. 380–389, 10 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Localization of temperature sensitive areas on analog circuitsEichenseer, C., Pöppel, G. & Mikolajick, T., 2014, In: Microelectronics Journal. 45, 6, p. 734-739Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Material prospects of reconfigurable transistor (RFETs) - From silicon to germanium nanowiresTrommer, J., Heinzig, A., Heinrich, A., Jordan, P., Grube, M., Slesazeck, S., Mikolajick, T. & 1 others, 2014, Materials Research Society Symposium ProceedingsElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Origin of the endurance degradation in the novel HfO₂-based 1T ferroelectric non-volatile memoriesYurchuk, E., Mueller, S., Martin, D., Slesazeck, S., Schroeder, U., Mikolajick, T., Muller, J. & 7 others, 2014, 2014 IEEE International Reliability Physics Symposium Proceedings, IRPS 2014Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Photomask CD and LER characterization using Mueller matrix spectroscopic ellipsometryHeinrich, A., Dirnstorfer, I., Bischoff, J., Meiner, K., Ketelsen, H., Richter, U. & Mikolajick, T., 2014, Proceedings of SPIE - The International Society for Optical EngineeringElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Reconfigurable silicon nanowire devices and circuits: Opportunities and challengesWeber, W., Trommer, J., Grube, M., Heinzig, A., König, M. & Mikolajick, T., 2014, Proceedings -Design, Automation and Test in Europe, DATEElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Scanning Spreading Resistance Microscopy analysis of locally blocked implant sitesDoering, S., Wachowiak, A., Winkler, U., Richter, M., Goehler, J., Roetz, H., Eckl, S. & 1 others, 2014, In: Microelectronic Engineering. 122, p.  77-81Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Scanning spreading resistance microscopy for failure analysis of nLDMOS devices with decreased breakdown voltageDoering, S., Rudolf, R., Pinkert, M., Roetz, H., Wagner, C., Eckl, S., Strasser, M. & 2 others, 2014, In: Microelectronics Reliability. 54, 9-10, p. 2128-2132Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Silicon heterojunction metal wrap through solar cells - A 3D TCAD simulation studyDirnstorfer, I., Simon, D., Leszczynska, B. & Mikolajick, T., 2014, EPJ Web of ConferencesElectronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Symmetrical Al₂O₃-based passivation layers for p- and n-type siliconSimon, D., Jordan, P., Dirnstorfer, I., Benner, F., Richter, C. & Mikolajick, T., 2014, In: Solar energy materials and solar cells. 131, p. 72-76, 5 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article