Publications

2013

• Impact of layer thickness on the ferroelectric behaviour of silicon doped hafnium oxide thin filmsGraham, A. P., Knebel, S., Melde, T., Mikolajick, T., Muller, J., Schroder, U., Sundqvist, J. & 1 others, 2013, In: Thin solid films. 533, p. 88-92Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Improvement of Al2O3 Passivation by Ti-DopingBenner, F., Knaut, M., Jordan, P. M., Dirnstorfer, I., Ocker, J., Bartha, J. W. & Mikolajick, T., 2013, p. 1156-1161, 6 p.Electronic (full-text) versionResearch output: Contribution to conferences > Paper
• Influence of frequency dependent time to breakdown on high-K/metal gate reliabilityKnebel, S., Kupke, S., Schroeder, U., Slesazeck, S., Mikolajick, T., Agaiby, R. & Trentzsch, M., 2013, In: IEEE transactions on electron devices : ED. 60, 7, p. 2368-2371, 4 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Inline-characterization and step coverage optimization of deposited dielectrics in DRAM structuresKrupinski, M., Kasic, A., Hecht, T., Klude, M., Heitmann, J., Erben, E. & Mikolajick, T., 2013, In: IEEE transactions on semiconductor manufacturing. 26, 2, p. 253-259, 7 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Key concepts behind forming-free resistive switching incorporated with rectifying transport propertiesShuai, Y., Ou, X., Luo, W., Mücklich, A., Bürger, D., Zhou, S., Wu, C. & 6 others, 2013, In: Scientific reports. 3, 2208Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Millisecond flash lamp annealing for LaLuO₃ and LaScO ₃ high-k dielectricsLehmann, J., Hübner, R., Borany, J. V., Skorupa, W., Mikolajick, T., Schäfer, A., Schubert, J. & 1 others, 2013, In: Microelectronic Engineering. 109, p. 381-384, 4 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• New color sensor concept based on single spectral tunable photodiodeWachowiak, A., Slesazeck, S., Jordan, P., Holz, J. & Mikolajick, T., 2013, ESSDERC 2013 - Proceedings of the 43rd European Solid-State Device Research Conference. IEEE Computer Society, Washington , p. 127-130, 4 p., 6818835Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Performance investigation and optimization of Si:HfO₂ FeFETs on a 28 nm bulk technologyMueller, S., Yurchuk, E., Slesazeck, S., Mikolajick, T., Müller, J., Herrmann, T. & Zaka, A., 2013, p. 248-251, 4 p.Electronic (full-text) versionResearch output: Contribution to conferences > Paper
• Reconfigurable nanowire electronics - Device principles and circuit prospectsWeber, W. M., Trommer, J., Martin, D., Grube, M., Heinzig, A. & Mikolajick, T., 2013, ESSDERC 2013 - Proceedings of the 43rd European Solid-State Device Research Conference. IEEE Computer Society, Washington , p. 246-251, 6 p., 6818865Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Reliability Characteristics of Ferroelectric Si: HfO2 Thin Films for Memory ApplicationsMikolajick, T., Mueller, S., Muller, J. & Schroeder, U., 2013, In: IEEE transactions on device and materials reliability. 13, 1, p. 93 - 97, 5 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article