Publications

2024

• High Gain Graphene Based Hot Electron Transistor with Record High Saturated Output Current DensityStrobel, C., Chavarin, C. A., Knaut, M., Völkel, S., Albert, M., Hiess, A., Max, B. & 3 others, Feb 2024, In: Advanced electronic materials. 10, 2, 7 p., 2300624Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Insights Into Curie-Temperature and Phase Formation of Ferroelectric Hf_1−xZr_xO₂ with Oxygen Defects from a Leveled Energy LandscapeAzevedo Antunes, L., Ganser, R., Schroeder, U., Mikolajick, T. & Kersch, A., 16 Jan 2024, In: Advanced materials interfaces. 11, 2, 2300710Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Smart Design of Fermi Level Pinning in HfO₂-Based Ferroelectric MemoriesBaumgarten, L., Szyjka, T., Mittmann, T., Gloskovskii, A., Schlueter, C., Mikolajick, T., Schroeder, U. & 1 others, 15 Jan 2024, In: Advanced functional materials. 34, 3, 16 p., 2307120Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Analysis and Compensation of the Series Resistance Effects on the Characteristics of Ferroelectric CapacitorsMassarotto, M., Driussi, F., Bucovaz, M., Affanni, A., Lancaster, S., Slesazeck, S., Mikolajick, T. & 1 others, 2024, 2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings. Institute of Electrical and Electronics Engineers (IEEE)Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Charge trapping challenges of CMOS embedded complementary FeFETsBeyer, S., Kleimaier, D., Dunkel, S., Mulaosmanovic, H., Soss, S., Muller, J., Jiang, Z. & 3 others, 2024, 2024 IEEE International Memory Workshop, IMW 2024 - Proceedings. Institute of Electrical and Electronics Engineers (IEEE)Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Coincidence Detection with an Analog Spiking Neuron Exploiting Ferroelectric PolarizationGibertini, P., Fehlings, L., Mikolajick, T., Chicca, E., Kappel, D. & Covi, E., 2024, ISCAS 2024 - IEEE International Symposium on Circuits and Systems. Institute of Electrical and Electronics Engineers (IEEE)Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Dynamic Reconfigurable Security Cells Based on Emerging Devices Integrable in FDSOI TechnologyBhattacharjee, N., Havel, V., Kumari, S., Kavand, N., Quijada, J. N., Kumar, A., Mikolajick, T. & 1 others, 2024, 2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 - Proceedings. Institute of Electrical and Electronics Engineers (IEEE), p. 171-176Research output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Ferroelectric materials and their applications for next-generation integrated devicesMikolajick, T., Schroeder, U., Lomenzo, P. D., Slesazeck, S. & Lancaster, S., 2024, 2024 IEEE International Electron Devices Meeting, IEDM 2024. Institute of Electrical and Electronics Engineers (IEEE), p. 1-4Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• HZO-based Nonvolatile SRAM Array with 100% Bit Recall Yield and Sufficient Retention Time at 85°CShuto, Y., Okuno, J., Yonai, T., Ono, R., Reinig, P., Lederer, M., Seidel, K. & 5 others, 2024, 2024 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2024. Institute of Electrical and Electronics Engineers (IEEE), p. 1-2Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Improving HfO2 Thick Films for SiC Power Devices by Si, Y and La DopingKrause, S., Mikolajick, T. & Schroeder, U., 2024, In: Solid State Phenomena. 359(2024), p. 29-34, 6 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article