Publications

2012

• Non-volatile data storage in HfO₂-based ferroelectric FETsSchroeder, U., Yurchuk, E., Mueller, S., Mueller, J., Slesazeck, S., Schloesser, T., Trentzsch, M. & 1 others, 2012, 2012 12th Annual Non-Volatile Memory Technology Symposium Proceedings, NVMTS 2012. p. 60-63, 4 p., 6632863Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• OFF-state induced threshold voltage relaxation after PBTI stressKupke, S., Knebel, S., Roll, G., Slesazeck, S., Mikolajick, T., Krause, G. & Kurz, G., 2012, 2012 IEEE International Integrated Reliability Workshop (IIRW). Institute of Electrical and Electronics Engineers (IEEE), p. 95-98, 4 p., 6468928Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Reliability of SrRuO3/SrTiO3/SrRuO3 Stacks for DRAM ApplicationsBottger, U., Knebel, S., Kupke, S., Mikolajick, T., Schmelzer, S. & Schroeder, U., 2012, In: IEEE electron device letters. 33, 12, p. 1699 - 1701Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Silicon and germanium nanoclusters embedded in zirconium dioxide matricesBenner, F., Haas, S., Schneider, F., Klemm, V., Schreiber, G., Von Borany, J., Mikolajick, T. & 1 others, 2012, In: ECS Journal of Solid State Science and Technology. 1, 6, p. N135-N138Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Ten-Nanometer Ferroelectric Si:HfO2 Films for Next-Generation FRAM CapacitorsMikolajick, T., Mueller, S., Muller, J., Schroeder, U. & Summerfelt, S. R., 2012, In: IEEE electron device letters. 33, 9, p. 1300 - 1302, 3 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article

2011

• Optimizing substrate surface and catalyst conditions for high yield chemical vapor deposition grown epitaxially aligned single-walled carbon nanotubesIbrahim, I., Bachmatiuk, A., Börrnert, F., Blüher, J., Wolff, U., Warner, J. H., Büchner, B. & 2 others, Dec 2011, In: Carbon. 49, 15, p. 5029-5037, 9 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Reduction of leakage currents with nanocrystals embedded in an amorphous matrix in metal-insulator-metal capacitor stacksKrause, A., Weber, W. M., Schroeder, U., Pohl, D., Rellinghaus, B., Heitmann, J. & Mikolajick, T., 28 Nov 2011, In: Applied physics letters. 99, 22Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Growth of catalyst-assisted and catalyst-free horizontally aligned single wall carbon nanotubesIbrahim, I., Bachmatiuk, A., Rümmeli, M. H., Wolff, U., Popov, A., Boltalina, O., Büchner, B. & 1 others, Nov 2011, In: Physica Status Solidi (B): Basic Research. 248, 11, p. 2467-2470, 4 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulationRoll, G., Jakschik, S., Burenkov, A., Goldbach, M., Mikolajick, T. & Frey, L., Nov 2011, In: Solid-state electronics. 65-66, 1, p. 170-176, 7 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Graphene: Piecing it TogetherRuemmeli, M. H., Rocha, C. G., Ortmann, F., Ibrahim, I., Sevincli, H., Boerrnert, F., Kunstmann, J. & 7 others, 18 Oct 2011, In: Advanced Materials. 23, 39, p. 4471-4490, 20 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article