Publications

2011

• Multiscale modeling of nanowire-based Schottky-barrier field-effect transistors for sensor applicationsNozaki, D., Kunstmann, J., Zörgiebel, F., Weber, W. M., Mikolajick, T. & Cuniberti, G., 12 Aug 2011, In: Nanotechnology. 22, 32, 325703Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Phase stabilization of sputtered strontium zirconateGrube, M., Martin, D., Weber, W. M., Mikolajick, T. & Riechert, H., Jul 2011, In: Microelectronic Engineering. 88, 7, p. 1326-1329, 4 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Synthesis of carbon nanotubes with and without catalyst particlesRuemmeli, M. H., Bachmatiuk, A., Boerrnert, F., Schaeffel, F., Ibrahim, I., Cendrowski, K., Simha-Martynkova, G. & 4 others, 7 Apr 2011, In: Nanoscale Research Letters. 6, 9 p., 303Electronic (full-text) versionResearch output: Contribution to journal > Review article
• Influence of composition and bottom electrode properties on the local conductivity of TiN/ HfTiO₂ and TiN/Ru/ HfTiO₂ stacksMartin, D., Grube, M., Reinig, P., Oberbeck, L., Heitmann, J., Weber, W. M., Mikolajick, T. & 1 others, 3 Jan 2011, In: Applied physics letters. 98, 1, 012901Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Evaluation of the electrical and physical properties of thin calcium titanate high-k insulators for capacitor applicationsKrause, A., Weber, W., Jahn, A., Pohl, D., Rellinghaus, B., Schroeder, U., Heitmann, J. & 1 others, 1 Jan 2011, In:  Journal of vacuum science & technology : JVST ; B, Nanotechnology & microelectronics : materials, processing, measurement, & phenomena. 29, 1Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Analysis of the effect of germanium preamorphization on interface defects and leakage current for high-k metal-oxide-semiconductor field-effect transistorRoll, G., Jakschik, S., Goldbach, M., Wachowiak, A., Mikolajick, T. & Frey, L., Jan 2011, In:  Journal of vacuum science & technology : JVST ; B, Nanotechnology & microelectronics : materials, processing, measurement, & phenomena. 29, 1, p. 01AA051-01AA055Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Applicability of molecular beam deposition for the growth of high-k oxidesGrube, M., Martin, D., Weber, W. M., Mikolajick, T., Bierwagen, O., Geelhaar, L. & Riechert, H., Jan 2011, In:  Journal of vacuum science & technology : JVST ; B, Nanotechnology & microelectronics : materials, processing, measurement, & phenomena. 29, 1, p. 01AC051-01AC053Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Macroscopic and microscopic electrical characterizations of high-k ZrO ₂ and ZrO₂/Al₂O₃/ZrO₂ metal-insulator-metal structuresMartin, D., Grube, M., Weinreich, W., Müller, J., Wilde, L., Erben, E., Weber, W. M. & 4 others, Jan 2011, In:  Journal of vacuum science & technology : JVST ; B, Nanotechnology & microelectronics : materials, processing, measurement, & phenomena. 29, 1, p. 01AC021-01AC028Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Direct Probing of Schottky Barriers in Si Nanowire Schottky Barrier Field Effect TransistorsGeelhaar, L., Grube, M., Heinzig, A., Martin, D., Mikolajick, T., Riechert, H. & Weber, W. M., 2011, In: Physical review letters. 107, 21, 216807Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Ferroelectricity in yttrium-doped hafnium oxideBoscke, T. S., Bottger, U., Frey, L., Kucher, P., Lemberger, M., Mikolajick, T., Muller, I. & 4 others, 2011, In: Journal of applied physics. 110, 114113 Electronic (full-text) versionResearch output: Contribution to journal > Research article