Publications

2011

• Polarity behavior and adjustment in silicon nanowire Schottky junction transistorsWeber, W. M., Heinzig, A. & Mikolajick, T., 2011, Dielectrics in Nanosystems -and- Graphene, Ge/III-V, Nanowires and Emerging Materials for Post-CMOS Applications 3. 3 ed., p. 93-101, 9 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• RF-Magnetron Sputtered Dielectric Backside PassivationBenner, F., Tarasova, M., Moll, P., Jakschik, S., Dirnstorfer, I., Knaut, M. & Mikolajick, T., 2011, Proceedings of the 26th European Photovoltaic Solar Energy ConferenceResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution

2010

• The influence of bottom oxide thickness on the extraction of the trap energy distribution in SONOS (silicon-oxide-nitride-oxide-silicon) structuresBernert, K., Oestreich, C., Bollmann, J. & Mikolajick, T., Jul 2010, In: Applied Physics A: Materials Science and Processing. 100, 1, p. 249-255, 7 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Improved high-temperature etch processing of high-k metal gate stacks in scaled TANOS memory devicesPaul, J., Beyer, V., Czernohorsky, M., Beug, M. F., Biedermann, K., Mildner, M., Michalowski, P. & 5 others, May 2010, In: Microelectronic Engineering. 87, 5-8, p. 1629-1633, 5 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• An empirical model describing the MLC retention of charge trap flash memoriesMelde, T., Hoffmann, R., Yurchuk, E., Paul, J. & Mikolajick, T., 2010, 2010 IEEE International Integrated Reliability Workshop Final Report, IIRW 2010. p. 118-120, 3 p., 5706502Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Carbon junction implant: Effect on leakage currents and defect distributionRoll, G., Jakschik, S., Goldbach, M., Mikolajick, T. & Frey, L., 2010, 2010 Proceedings of the European Solid State Device Research Conference, ESSDERC 2010. p. 329-332, 4 p., 5618224Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Investigation of nano-patterned PZT thin films by piezoresponse force microscopyWaegner, M., Haußmann, A., Hoffmann, M., Suchaneck, G., Gerlach, G. & Eng, L. M., 2010, Electronics System Integration Technology Conference, ESTC 2010 - Proceedings. 5642928Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Reliability of Al2O3-doped ZrO2 high-k dielectrics in three-dimensional stacked metal-insulator-metal capacitorsErben, E., Heitmann, J., Jegert, G., Kerber, M., Knebel, S., Mikolajick, T., Schroeder, U. & 3 others, 2010, In: Journal of applied physics. 108, 124104 Electronic (full-text) versionResearch output: Contribution to journal > Research article

2009

• Unravelling the mechanisms behind mixed catalysts for the high yield production of single-walled carbon nanotubesTetali, S., Zaka, M., Schönfelder, R., Bachmatiuk, A., Börrnert, F., Ibrahim, I., Lin, J. H. & 4 others, 22 Dec 2009, In: ACS Nano. 3, 12, p. 3839-3844, 6 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Nonvolatile Memory Concepts Based on Resistive Switching in Inorganic MaterialsKever, T., Kund, M., Mikolajick, T. & Salinga, M., 2009, In: Advanced engineering materials. 11, 4, p. 235-240, 6 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article