Publications

2023

• Modulation Doping of Silicon Nanowires to Tune the Contact Properties of Nano-Scale Schottky BarriersNagarajan, S., Hiller, D., Ratschinski, I., König, D., Smith, S. C., Mikolajick, T. & Trommer, J., 31 Oct 2023, In: Advanced materials interfaces. 11(2024), 1, 8 p., 2300600Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Polarization Switching and Charge Trapping in HfO₂-Based Ferroelectric TransistorsZhou, H., Ocker, J., Muller, S., Pesic, M. & Mikolajick, T., 24 Oct 2023, In: IEEE electron device letters. 44, 11, p. 1903-1906, 4 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• The Electrode-Ferroelectric Interface as the Primary Constraint on Endurance and Retention in HZO-Based Ferroelectric CapacitorsAlcala, R., Materano, M., Lomenzo, P. D., Vishnumurthy, P., Hamouda, W., Dubourdieu, C., Kersch, A. & 3 others, 18 Oct 2023, In: Advanced functional materials. 33, 43, 2303261Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Dopant segregation effects on ohmic contact formation in nanoscale siliconNagarajan, S., Mikolajick, T. & Trommer, J., Oct 2023, In: Solid-state electronics. 208, 108739Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Characterizations and Inkjet Printing of Carbon Black Electrodes for Dielectric Elastomer ActuatorsYi, J., Babick, F., Strobel, C., Rosset, S., Ciarella, L., Borin, D. Y., Wilson, K. E. & 3 others, 6 Sep 2023, In: ACS applied materials & interfaces. 15, 35, p. 41992-42003, 12 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Reliability characterization of non-hysteretic charge amplification in MFIM deviceEngl, M., Mikolajick, T. & Slesazeck, S., Sep 2023, In: Solid-state electronics. 207, 108721Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Novel Mixed-Dimensional hBN-Passivated Silicon Nanowire Reconfigurable Field Effect Transistors: Fabrication and CharacterizationGhosh, S., Khan, M. B., Chava, P., Watanabe, K., Taniguchi, T., Prucnal, S., Hübner, R. & 3 others, 30 Aug 2023, In: ACS Applied Materials and Interfaces. 15, 34, p. 40709-40718, 10 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Role of Defects in the Breakdown Phenomenon of Al_1-xSc_xN: From Ferroelectric to Filamentary Resistive SwitchingGuido, R., Mikolajick, T., Schroeder, U. & Lomenzo, P. D., 9 Aug 2023, In: Nano letters. 23, 15, p. 7213-7220, 8 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Correlating elemental compositions and charge carrier profiles in ultra-pure GaN/AlGaN stacks grown by molecular beam epitaxySchmult, S., Appelt, P., Silva, C., Wirth, S., Wachowiak, A., Großer, A. & Mikolajick, T., 1 Jul 2023, In:  Journal of vacuum science & technology : JVST ; A, Vacuum, surfaces, and films. 41, 4, 5 p., 042702Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Optical Properties of Ferroelectric Films Hf_xZr_yO₂ and La:Hf_xZr_yO₂ according to Ellipsometry DataKruchinin, V. N., Spesivtsev, E. V., Rykhlitsky, C. V., Gritsenko, V. A., Mehmood, F., Mikolajick, T. & Schroeder, U., Jul 2023, In: Optics and Spectroscopy. 131, 7, p. 550-553, 4 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article