Publications
The Research Portal (FIS) of TU Dresden provides a detailed search for publications in the School of Engineering Sciences.
21849 Entries
2010
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0.18-V input charge pump with forward body biasing in startup circuit using 65nm CMOS, 22 Sep 2010, IEEE Custom Integrated Circuits Conference 2010. Institute of Electrical and Electronics Engineers (IEEE), p. 1-4, 4 p., 5617444Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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0.5-V input digital LDO with 98.7% current efficiency and 2.7-µA quiescent current in 65nm CMOS, 22 Sep 2010, IEEE Custom Integrated Circuits Conference 2010. Institute of Electrical and Electronics Engineers (IEEE), p. 1-4, 4 p., 5617586Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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EMI Camera LSI (EMcam) with 12 × 4 on-chip loop antenna matrix in 65-nm CMOS to measure EMI noise distribution with 60-µm spatial precision, 22 Sep 2010, IEEE Custom Integrated Circuits Conference 2010. Institute of Electrical and Electronics Engineers (IEEE), p. 1-4, 4 p., 5617413Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Failure mechanism of solder interconnections under thermal cycling conditions, 16 Sep 2010, 3rd Electronics System Integration Technology Conference ESTC. Institute of Electrical and Electronics Engineers (IEEE), p. 1-8, 8 p., 5642843Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Impact of thermal aging on the thermal fatigue durability of Pb-free solder joints, 16 Sep 2010, 3rd Electronics System Integration Technology Conference ESTC. Institute of Electrical and Electronics Engineers (IEEE), p. 1-10, 10 p., 5642908Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Influence of metallographic preparation on EBSD characterization of Cu wire bonds, 16 Sep 2010, 3rd Electronics System Integration Technology Conference ESTC. Institute of Electrical and Electronics Engineers (IEEE), p. 1-5, 5 p., 5642846Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Influence of nano silver filler content on properties of ink-jet printed structures for microelectronics, 16 Sep 2010, 3rd Electronics System Integration Technology Conference ESTC. Institute of Electrical and Electronics Engineers (IEEE), p. 1-5, 5 p., 5642899Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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The scaling effect on microstructure and creep properties of Sn-based solders, 16 Sep 2010, 3rd Electronics System Integration Technology Conference ESTC. Institute of Electrical and Electronics Engineers (IEEE), p. 1-8, 8 p., 5642825Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Experimentally based strategy for damage analysis of textile-reinforced composites under static loading, 15 Sep 2010, In: Composites Science and Technology. 70, 9, p. 1330-1337, 8 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
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A Rule-Based Language for Complex Event Processing and Reasoning, 1 Sep 2010, Web Reasoning and Rule Systems - Fourth International Conference. Hitzler, P. & Lukasiewicz, T. (eds.). Springer, Berlin [u. a.], p. 42-57, 16 p., (LNCS)Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution