Proceedings

41 bis 50 von 87 Einträgen

Stintz, M.; Barthel, H.; Moinpour, M.: Particle Metrology in CMP Slurries – Potential and Limitations of Relevant Measuring Methods. In: MRS Spring Meeting (2007)

Nogowsk, A.; Kätzel, U.; Stintz, M.; Barthel, H.: Large particle counting for quality control. In: PARTEC 2007 - International Congress on Particle Technology (2007)

Nogowski, A.; Stintz, M.; Barthel, H.: Large particle counting for quality control of CMP slurries. In: ICPT 2007 (2007)

Sobisch, T.; Lerche, D.; Babick, F.; Salas, G. Salinas: Particle interactions in dispersions of micro and nanoparticles / Sedimentation of Colloidal Particles. In: PARTEC 2007 - International Congress on Particle Technology (2007)

Babick, F.; Kätzel, U.; Paciejewska, K.; Vorbau, M.; Stintz, M.; Barthel, H.: Sedimentation behaviour of suspensions of pyrogenic silica. In: PARTEC 2007 - International Congress on Particle Technology (2007)

Geers, H.; Witt, W.; Babick, F.: Stability Analysis of Emulsions and Suspensions with Photon Cross-correlation Spectroscopy. In: PARTEC 2007 - International Congress on Particle Technology (2007)

Paciejewska, K.; Babick, F.; Stintz, M.; Lange, R.: Conditioning of binary suspensions of colloidal metal oxides particles. In: PARTEC 2007 - International Congress on Particle Technology (2007)

Hillemann, L.; Stintz, M.: Determination of the charge distribution of unipolar charged aerosols. In: PARTEC 2007 - International Congress on Particle Technology (2007)

Gabsch, S.; Wessely, B.; Babick, F.; Stintz, M.: The Influence of Particle Shape and Orientation on the Results of the Dynamic Extinction Measurement. In: PARTEC 2007 - International Congress on Particle Technology (2007)

Stintz, M.: ISO Standardization in Nanotechnology Terminology and Definitions. In: PARTEC 2007 - International Congress on Particle Technology (2007)

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André Kupka
Last modified: Nov 30, 2017