X-ray tomography
X-ray tomographic measurements provide three-dimensional images of a wide variety of objects, which are calculated from a large number of X-ray images taken from different angles. It is therefore possible to look into samples - even if they are opaque - without destroying them. At our professorship, we have specialized in so-called X-ray microtomography, which means that we primarily examine small samples with dimensions of a few centimeters, but with a resolution in the lower micrometer range.
Our activities and competences in this field are focused on two main areas: On the one hand, we use this measurement technology to conduct fundamental research on processes, e.g. depth filtration, or on new materials, such as magnetic hybrid materials. The focus is on questions such as the behavior of samples under the influence of magnetic fields, which we investigate with special magnetic measuring cells designed for our tomography system.
On the other hand, a major focus of our work is on method development. This includes the construction of tomography systems as well as their optimization, e.g. for very fast measurements, and the development of software solutions for efficient reconstruction of tomograms from raw data. In addition, special calibration and correction methods are developed to improve the quality of the image data, as well as evaluation programs whose function is determined by the respective questions concerning the samples.
In these areas, student work and SHK activities are offered on a regular basis, which provide points of contact to current research questions already during the studies.
Contact person: Dr. Stefan Günther