Subproject B04
Table of contents
2nd Funding Period
Potential Landscape and Electronic Properties of Twisted and Curved 2D Materials
The project will develop and employ advanced transmission electron microscopy (TEM) techniques with focus on electron holography (EH) and electron-energy-loss spectroscopy (EELS) to facilitate the characterization of selected twisted and bent 2DMs hosting correlated electronic states. We specifically aim at revealing the structure and potential landscape in real space down to atomic resolution and observing low energy electronic excitations both in real and reciprocal space.
1st Funding Period
Revealing Atomic Structure and Potential Landscape and Electronic Properties of 2D Materials with Electron Holography and Electron Spectroscopies
The project will develop atomic resolution off-axis electron holography (EH) into a characterization tool for synthetic 2DMs. This will 1) enhance the spatial and signal resolution currently achievable with conventional high-resolution transmission electron microscopy (HRTEM) at 2DMs, 2) provide access to electrostatic potential and charge distribution features at the atomic scale, and 3) reveal high-resolution information about the configuration of defect and edge states, chemical composition and morphology in synthetic 2DMs. In combination electron diffraction (ED) and electron-energy-loss spectroscopy (EELS) as well as in-situ application of temperature and electron irradiation, the scope of electron microscopy and spectroscopy will thereby increase significantly for 2DMs.
Principal investigator
Prof. Dr. Axel Lubk