Publications

2026

• Reversible and Controllable Transition Between Filamentary and Interfacial Resistive Switching in HfO₂-Based MemristorsWu, C., Shen, H., Schroedter, R., Peng, C., Hoffman, H., Slesazeck, S., Tetzlaff, R. & 2 others, 5 Jan 2026, In: Advanced electronic materials. e00644Electronic (full-text) versionResearch output: Contribution to journal > Research article

2025

• Design and Evaluation of an RFET Standard Cell Library Compatible with 22 nm FDSOIKavand, N., Darjani, A., Bhattacharjee, N., Quijada, J. N., Martinez, J. P., Mikolajick, T., Trommer, J. & 1 others, 31 Dec 2025, In: IEEE transactions on computer-aided design of integrated circuits and systemsElectronic (full-text) versionResearch output: Contribution to journal > Research article
• Nitride Ferroelectric Domain Wall Memory for Next-Generation ComputingSchönweger, G., Dasenbrook, D., Kyoushi, N., Guido, R., Petraru, A., Mikolajick, T., Schröder, U. & 2 others, 23 Dec 2025, In: Advanced electronic materials. e00616Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Impact of Bias temperature instability on reconfigurable field effect transistors and circuitsGalderisi, G., Mikolajick, T. & Trommer, J., 15 Nov 2025, In: Microelectronic Engineering. 300, 9 p., 112374Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Controlling the Wake-Up Mechanism and Switching Kinetics of Ferroelectric Hf _xZr_{1 –  x}O₂through Hf Content ModulationSunil, A., Alcala, R., Silva, C., Mikolajick, T. & Lancaster, S., 12 Nov 2025, In: ACS Applied Materials and Interfaces. 17, 45, p. 62708-62719, 12 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Process Integration of U-Shape Ambipolar Schottky–Barrier Field-Effect TransistorsCakirlar, C., Neckel Wesling, B., Moustakas, K., Galderisi, G., Pelloquin, S., Baumgartner, O., Thesberg, M. & 3 others, 4 Nov 2025, In: Advanced electronic materials. 11, 18, e00310Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf_0.5Zr_0.5O₂ ferroelectric capacitors probed by hard x-ray photoelectron spectroscopyHamouda, W., Yamashita, Y., Ueda, S., Matzen, S., Renault, O., Mehmood, F., Mikolajick, T. & 2 others, 3 Nov 2025, In: Applied physics letters. 127, 18, 182902Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Does a Morphotropic Phase Boundary Exist in Zr_xHf_1-xO₂-Based Thin Films?Vishnumurthy, P., Ganser, R., Kim, D. G., Jeon, I., Jung, C. H., Lim, H., Mikolajick, T. & 3 others, 26 Oct 2025, In: Advanced functional materials. 12 p., e22802Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Peak Splitting and Bias Fields in Ferroelectric Hafnia Mediated by Interface Charge EffectsEngl, M., Hamouda, W., Häusler, I., Lancaster, S., Carpentieri, L., Mikolajick, T., Dubourdieu, C. & 1 others, 10 Sep 2025, In: ACS Applied Materials and Interfaces. 17, 36, p. 51468-51475, 8 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Emerging applications: Neuromorphic computing and reservoir computingToprasertpong, K., Mikolajick, T., Datta, S., Huang, Q. & Takagi, S., Sep 2025, In: MRS bulletin. 50, 9, p. 1032–1042, 11 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article