© Juliane Bauch
Short overview of the Working Group
The Physical Materials Diagnostics Research Group operated the Special X-ray Laboratory until 2026. Its main areas of focus were:
- Method development in the field of X-ray microdiffraction (including at the synchrotron)
- Functional materials for microelectronics
- Precision orientation determination at the single-grain level (KOSSEL technique)
- Determination of minute symmetry reductions (KOSSEL technique)
- Precision lattice constant determination and high-spatial-resolution Type III residual stress analysis (KOSSEL technique)
- Phase identification in the macro- and micro-ranges
- Quality inspection of bulk single crystals
- Orientation mapping and texture analysis at the macro- and micro-scales using EBSD
- Digital image processing of micro-diffraction images
In addition, we offered imaging of “internal” material defects in compact specimens and components (X-ray and ultrasonic inspection). In the field of defectoscopy, we had equipment for locating surface defects and near-surface defects, as well as endoscopic methods for the visual inspection of hard-to-reach areas of compact components.
We were a member of SAWLab-Saxony.