Brief Overview of the Working Group

The Working Group on Physical Materials Diagnostics operated the Special X-ray Laboratory. Its main areas of focus were:

• Method development in the field of X-ray microdiffraction (including at the synchrotron)
• Functional materials for microelectronics
• Precision orientation determination at the single-grain level (KOSSEL technique)
• Determination of minute symmetry reductions (KOSSEL technique)
• Precision lattice constant determination and high-spatial-resolution Type III residual stress analysis (KOSSEL technique)
• Phase identification in the macro- and micro-ranges
• Quality inspection of bulk single crystals
• Orientation mapping and texture analysis at the macro- and micro-scales using EBSD
• Digital image processing of micro-diffraction images

In addition, imaging of “internal” material defects in compact samples and components was offered (X-ray and ultrasonic inspection). In the field of defectoscopy, the research group had equipment for locating surface defects and near-surface defects, as well as endoscopic methods for the visual inspection of hard-to-reach areas of compact components.

We were a member of SAWLab-Saxony.