Short overview of the Working Group

The Working Group for Physical Materials Diagnostics operates the "röntgenographisches Speziallabor" (specialist X-ray Lab). Key activities are:

• Methods development in the area of X-ray micro-diffraction (also at the synchrotron)
• Functional materials of microelectronics
• Highly precise orientation determination of single crystals (KOSSEL technique)
• Determination of the lowest crystal symmetry reduction (KOSSEL technique)
• Highly precise determination of lattice constants and highly spatially resolved residual stress analysis III. Type (KOSSEL technique)
• Phase identification on the macro- and micro-scale
• Quality control of massive single crystals
• Orientation mapping and texture analysis on the macro- and micro-scale using EBSD
• Digital image processing in micro diffraction images

In addition, we offer imaging of "inner" material defects in compact specimens and components (X-ray and ultrasonic inspection). In the field of defectoscopy, we have devices for the location of surface defect and near-surface defects as well as endoscopic methods for the visual examination of areas with difficult access of compact components.

We are a member of SAWLab-Saxony.