Another important milestone reached!

Grazing Incidence Diffraction at SIRIUS

Together with guest researchers from the Institute of Physics of the Czech Academy of Sciences we started our first Grazing Incidence Diffraction (GID) experiments as a function of temperature at SIRIUS!

Our primary objective is to leverage our high-resolution GID capabilities to determine the temperature-dependent strain in thin films. To achieve this, we have now enabled the full 6-circle mode of SIRIUS, allowing us to probe the atomic structure of thin films with high precision. This capability, combined with our intense Ga Kalpha x-ray source and our newly integrated baby-cryostat, now enables us to explore thin films under varying temperatures with outstanding sensitivity.

We are excited to report that this approach appears to be working splendidly! The initial results are very promising!