New Scanning Electron Microscope
The Institute of Construction Materials has a new Environmental Scanning Electron Microscope (ESEM) with field emitter since December 2014: QUANTA FEG 250 (FEI). The microscope is equipped with EDX and µRFA, both of BRUKER. The special feature is to directly characterize non-conductive samples in their natural state at various climates with up to 100 % relative humidity.
The QUANTA FEG 250
Backside view with EDX and µRFA
Vacuum ranges
High vacuum 6 x 10-4 Pa
Low vacuum 10 – 130 Pa.
ESEM mode 10 – 4000 Pa
resolution ranges
1.0 nm at 30 kV in high vacuum (SE)
1.4 nm at 30 kV in low vacuum and ESEM mode (SE)
3 nm at 1 kV in high vacuum (SE)
3 nm at 3 kV in low vacuum (SE)
2.5 nm at 30 kV in high vacuum and low vacuum (BSE)