Lukas Furtner

2025

• A combined approach to optimization of soft sensor architecture and physical sensor configurationFurtner, L. W., Viedt, I. & Urbas, L., 1 Jul 2025, Proceedings of the 35th European Symposium on Computer Aided Process Engineering (ESCAPE 35). Van Impe, J., Léonard, G., Bhonsale, S. S., Polanska, M. & Logist, F. (eds.).p. 1445-1449, 5 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Differentiation between Process and Equipment Drifts in Chemical PlantsEydam, L., Furtner, L., Lorenz, J. & Urbas, L., 1 Jul 2025, Proceedings of the 35th European Symposium on Computer Aided Process Engineering (ESCAPE 35). Van Impe, J., Léonard, G., Bhonsale, S. S., Polanska, M. & Logist, F. (eds.).p. 1396-1402, 7 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution

2024

• Self-Evaluation of Trajectory Predictors for Autonomous DrivingKarle, P., Furtner, L. & Lienkamp, M., 29 Feb 2024, In: Electronics. 13, 5, p. 1-16, 16 p., 946Electronic (full-text) versionResearch output: Contribution to journal > Research article
• An Uncertainty Analysis Based Approach to Sensor Selection in Chemical ProcessesFurtner, L., Mädler, J. & Urbas, L., 2024, 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation, ETFA 2024. Facchinetti, T., Cenedese, A., Bello, L. L., Vitturi, S., Sauter, T. & Tramarin, F. (eds.). Institute of Electrical and Electronics Engineers (IEEE), 4 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution

2023

• Standards for Information Models Considering Knowledge Distribution in Modular PlantsKoch, A., Hamedi, N., Furtner, L., Kock, T., Klose, A. & Madler, J., 2023, 2023 IEEE 21st International Conference on Industrial Informatics, INDIN 2023. Dorksen, H., Scanzio, S., Jasperneite, J., Wisniewski, L., Man, K. F., Sauter, T., Seno, L., Trsek, H. & Vyatkin, V. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 1-7Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution

2020

• Utilizing uncertainty information in remaining useful life estimation via Bayesian neural networks and Hamiltonian Monte CarloBenker , M., Furtner, L., Semm, T. & Zaeh, M. F., 7 Dec 2020, In: Journal of manufacturing systems : an official journal of the Society of Manufacturing Engineers (SME). 61, p. 799 - 807Electronic (full-text) versionResearch output: Contribution to journal > Research article