Scanning electron microscopy
High-resolution low-voltage scanning electron microscope with field emission cathode Zeiss DSM 982 Gemini
DSM 982
- Resolution: sample-dependent, 1 nm at 20 kV, 4 nm at 1 kV
- Conducive magnification: 100,000x - 200,000x -
- Equipped with SE, SE-Inlens and BSE detector (Robinson detector)
- Pixel resolutions of the images freely selectable via external image acquisition and beam control system DISS from Point-electronic
Conventional scanning electron microscope with tungsten cathode Zeiss DSM 950
DSM 950
- Resolution: sample-dependent, approx. 10 nm at 20 kV
- Conducive magnification: 20,000x - 30,000x
- Standard SE detector and 3d BSE detector (point-electronic) with MeX software (Alicona)
- 3d reconstructions of the surface, roughness measurements
- Pixel resolutions of the images freely selectable by external image acquisition and beam control system DISS from Point-electronic
- Noran system 7 -EDX system with SDD detector
Contact person:
© Axel Mensch
Wissenschaftlicher Mitarbeiter
NameMr Dipl.-Phys. Axel Mensch
Laborleiter Elektronenmikroskopie, Webredakteur Professur für Biomaterialien
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© Silvia Mühle
Technische Mitarbeiterin
NameMs Dipl.-Ing. Silvia Mühle
Operatorin Rasterelektronenmikroskopie
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