The Dresden Center for Nanoanalysis (DCN) has installed two special microscopes and started a three-year research project with focus on one-dimensional electronics. The results will be analyzed within the paths „Silicon Nanowire“ and „Carbon“ of the Center for Advancing Electronics Dresden (cfaed) of the Technische Universität (TU) Dresden. Particularly, a scanning electron microscope with a focused ion beam (SEM/FIB) and a sub-micrometer X-ray tomograph were purchased. Additionally needed major equipment - including a nano X-ray tomograph and a transmission electron microscope – which are available at the TU and the cooperative research institutes, can be used for the research project. The project is granted with about 3.2 millions of Euros by the Federal Ministry for Education and Research. In October, three staff members - a postdoc, a PhD student and a technician - started their work. With this funding, the further development of DCN as a technological platform of cfaed and TU Dresden is supported.In the project managed by Professor Ehrenfried Zschech, reliability-limiting degradation mechanisms in one-dimensional devices systems will be analyzed in order to establish a basis for process development and quality control of future microelectronic products. Innovative electronic devices based on one-dimensional nanostructures like silicon nanowires and carbon nanotubes as well as nanoscale sensors are expected to have a much higher performance than current CMOS devices and sensor systems. Thus, new applications will become possible in the fields of automotive, mechanical engineering, logistics, energy, sensor technology as well as medical engineering and health monitoring. Through close collaboration with innovative companies, the research will be oriented toward an industrial use right from the start.

A public DCN Colloquium about Nanoanalysis takes place on December 2, 2013, 2 - 5pm, at SLUB Dresden, Zellescher Weg 18, 01069 Dresden.

Further enqiries:
Prof. Dr. Ehrenfried Zschech
Honorary Professor Nanoanalysis
Dresden Center for Nanoanalysis (DCN)
+49 351 463-41093

Birgit Holthaus
Press Officer
Center for Advancing Electronics Dresden
+49 351 463-42848