The tradition of the IFE dates back to 1971, when Dr. Ludwig Walter was appointed as a full professor for Technological Processes of Electronics at the Department of Electronics Technology and Precision Engineering at TU Dresden. At that time, Prof. Walter initiated research work on the development of high-resolution infrared sensors, intended to be used for the optical inspection of electronic assemblies. In a short time, this led to the establishment of the field of infrared measurement technology, which encompassed not only the production of IR-sensitive materials, the development of corresponding technological processes, and the design and manufacture of IR sensors, but also their application in a wide range of metrological uses.

Infrared measurement technology remains an important pillar of the Institute for Solid State Electronics. However, the research scope of the IFE has since significantly expanded to include (preferably hydrogel-based) piezoresistive sensors, ultrasonic sensors, nano-optical sensors, and functional thin films. All of these topics are characterized by a close interconnection between materials, technologies, modeling and simulation, design, and metrological applications.