Publications
The Research Portal (FIS) of TU Dresden provides a detailed search for publications in the School of Engineering Sciences.
20630 Entries
2010
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Integrated Adjustable Phase Shifters, Oct 2010, In: IEEE Microwave Magazine. 11, 6, p. 97-108, 12 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
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Texture, microstructure and mechanical properties of ultrafine grained aluminum produced by accumulative roll bonding, Oct 2010, In: Advanced Engineering Materials. 12, 10, p. 989-994, 6 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
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Zum methodischen Konstruieren von Leichtbaustrukturen aus kohlenstofffaserverstärkten Kunststoffen, Oct 2010, In: Konstruktion. 10, p. 69-74, 6 p.Research output: Contribution to journal > Research article
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Pulsed stress behavior of platinum thin films, 26 Sep 2010, 2010 IEEE 16th International Symposium for Design and Technology in Electronic Packaging (SIITME). Institute of Electrical and Electronics Engineers (IEEE), p. 83-88, 6 p., 5651534Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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0.18-V input charge pump with forward body biasing in startup circuit using 65nm CMOS, 22 Sep 2010, IEEE Custom Integrated Circuits Conference 2010. Institute of Electrical and Electronics Engineers (IEEE), p. 1-4, 4 p., 5617444Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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0.5-V input digital LDO with 98.7% current efficiency and 2.7-µA quiescent current in 65nm CMOS, 22 Sep 2010, IEEE Custom Integrated Circuits Conference 2010. Institute of Electrical and Electronics Engineers (IEEE), p. 1-4, 4 p., 5617586Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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EMI Camera LSI (EMcam) with 12 × 4 on-chip loop antenna matrix in 65-nm CMOS to measure EMI noise distribution with 60-µm spatial precision, 22 Sep 2010, IEEE Custom Integrated Circuits Conference 2010. Institute of Electrical and Electronics Engineers (IEEE), p. 1-4, 4 p., 5617413Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Failure mechanism of solder interconnections under thermal cycling conditions, 16 Sep 2010, 3rd Electronics System Integration Technology Conference ESTC. Institute of Electrical and Electronics Engineers (IEEE), p. 1-8, 8 p., 5642843Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Impact of thermal aging on the thermal fatigue durability of Pb-free solder joints, 16 Sep 2010, 3rd Electronics System Integration Technology Conference ESTC. Institute of Electrical and Electronics Engineers (IEEE), p. 1-10, 10 p., 5642908Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
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Influence of metallographic preparation on EBSD characterization of Cu wire bonds, 16 Sep 2010, 3rd Electronics System Integration Technology Conference ESTC. Institute of Electrical and Electronics Engineers (IEEE), p. 1-5, 5 p., 5642846Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution