1996

• Application of polymer matrix composite materials for structural components of small satellitesGöhler, W., Seifart, K., Hufenbach, W. & Holste, C., 1996, International Conference on Spacecraft Structures, Materials and Mechanical Testing. p. 501-505, 5 p.Electronic (full-text) versionResearch output: Contribution to book/conference proceedings/anthology/report > Conference contribution
• Communication by chaotic signals: The inverse system approach (Best Paper Award 1996)Feldmann, U., Hasler, M. & Schwarz, W., 1996, In: International journal of circuit theory and applications. 24, 5, p. 551-579, 29 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Compact model for the grounded-gate nMOS behaviour under CDM ESD stressRuss, C., Verhaege, K., Bock, K., Roussel, P. J., Groeseneken, G. & Maes, H. E., 1996, In:  Electrical Overstress Electrostatic Discharge Symposium proceedings. p. 302-315, 14 p.Research output: Contribution to journal > Conference article
• Computing the generic index of the circuit equations of linear active networksReissig, G. & Feldmann, U., 1996, In: Proceedings - IEEE International Symposium on Circuits and Systems. 3, p. 190-193, 4 p.Electronic (full-text) versionResearch output: Contribution to journal > Conference article
• Der Ingenieurdesigner - Lückenbüßer oder Leitfigur?Groh, R. & Theska, R., 1996Research output: Contribution to conferences > Paper
• Designing ceramic/metal compositesHufenbach, W. & Gerhardy, T., 1996, In: Ceramic forum international : cfi. 73, 3, p. 173-176, 4 p.Research output: Contribution to journal > Research article
• Fail-Aware Failure DetectorsFetzer, C. & Cristian, F., 1996, p. 200-209, 10 p.Electronic (full-text) versionResearch output: Contribution to conferences > Paper
• Fail-Awareness in Timed Asynchronous SystemsFetzer, C. & Cristian, F., 1996, p. 314-321, 8 p.Electronic (full-text) versionResearch output: Contribution to conferences > Paper
• Pulsed stress reliability investigations of Schottky diodes and HBTSSchüßler, M., Krozer, V., Bock, K. H., Brandt, M., Vecci, L., Losi, R. & Hartnagel, H. L., 1996, In: Microelectronics Reliability. 36, 11-12 , p. 1907-1910, 4 p.Electronic (full-text) versionResearch output: Contribution to journal > Research article
• Scaling behaviour of the correlation length for the two-point correlation function in the random field Ising chainLange, A. & Stinchcombe, R., 1996, In: Journal of Physics A: Mathematical and General. 29, p. 3495-3502Research output: Contribution to journal > Research article