Subproject B02

X-Ray Diffraction Studies of 2D Materials

The  project determines the global average structure and local structural deviations for synthetic 2DMs by means of advanced surface X-ray diffraction techniques. Furthermore, the morphology of these materials will be characterized in terms of texture as well as domain and grain sizes. These experiments shall be done on few- and even monolayer systems, such as Zr-based metal organic frameworks (MOFenes). To this end, surface X-ray diffraction will be combined with studies of the pair distribution function and diffuse scattering.

Principal investigator

Prof. Dr. Jochen Geck

Project status

Project completed 06/2024.