Publikationen
- Prof.Dr.-Ing.habil. M. Schröter
- Offizielle Veröffentlichungen
- Thermal impedance of SiGe HBTs:Characterization and modeling
- Methods for Extracting the Temperature and Power Dependent Thermal Resistance for SiGe and III-V HBTs from DC Measurements: A Review and Comparison Across Technologies
- Geometry scalable compact modeling of GaAs HBTs
- A Physics-Based Analytical Formulation for the Tunneling Current through the Base of Bipolar Transistors Operating at Cryogenic Temperatures
- Device modeling tools and their application to SiGe HBT development
- Long-Term Large-Signal RF Reliability Characterization of SiGe HBTs Using a Passive Impedance Tuner System
- Characterization of Dynamic Large-Signal Operating Limits and Long-Term RF Reliability of SiGe HBTs
- An Experimental Load-Pull Based Large-Signal RF Reliability Study of SiGe HBTs
- A compact physical expression for the static drain current in heterojunction barrier CNTFETs
- Compact formulation for the bias dependent quasistatic mobile charge in Schottky-barrier CNTFETs