Details zur Lehrveranstaltung
| Transmission Electron Microscopy | |
| Modul: | Phy-Ma-Vert: Physikalische Vertiefung |
| Lecture language | English |
| Summary of Lecture: | Basic principles of TEM instrumentation, application of optical principles, electron emission and beam formation, electron optics (magnetic lenses, deflectors, aberrations), wave optics with electrons (diffraction, interference), electron microscopy and holography at atomic resolution. |
| data set up-to-date | |
| Scope: | lecture: 2 hours/week |
| Time/location: | DO(6) REC/C118 |
| Audience: | Vertiefung Bachelor (PV) und Master (alle) |
| Specialization area: | Festkörper- und Materialphysik (Elektronische Eigenschaften von Festkörpern) (Vorlesung im Wahlpflichtvertiefungsgebiet, masterartig) |
| Previous knowledge: | Mechanics, electrodynamics, quantum mechanics, statistical physics | Certificate: |
| Enrolment: | by 4 November 2020 / see OPAL |
| Web-reference: | https://bildungsportal.sachsen.de/opal/auth/RepositoryEntry/26447806464 |
| This lecture is organized via OPAL - the online platform for academic learning of the TU Dresden. Please follow the corresponding link for registration and further information. Please note that access to OPAL is possible only by login credentials for the TU Dresden - external students need to apply for guest account in advance: https://selfservice.zih.tu-dresden.de/index.php/login | |